University of Tennessee at Chattanooga
Analysis of two-stage shunt capacitor bank protection deficiencies with mitigation suggested
Abstract
dc:description.abstractA large utility was experiencing a problem when switching a two-stage capacitor bank resulting in misoperations of the bank protection. When the bypass switch is opened a long duration dc offset occurs across all capacitors. This dc causes saturation of the tap point VT resulting in a false differential voltage and misoperation of the protection. The utility had to disable the voltage differential during switching until the phenomenon could be studied and a suitable solution found. The work is a comprehensive analysis of the transients affecting the protection and how the problem could be mitigated. An analytical approach was taken to understand the occurrence of the dc offset and an Electromagnetics Transients Program (EMTP) was used to study various mitigation techniques. A simple solution is presented for future installations that prevents the problem completely. A “next best” mitigation is presented for existing banks where reconfiguration would not be cost justified.
Degree
thesis:*- Grantor dc:publisher
- University of Tennessee at Chattanooga
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Patterson, Russell William
- Contributors dc:contributor
-
- Eltom, Ahmed H.
- Sisworahardjo, Nurhidajat; Kobet, Gary L.
- College of Engineering and Computer Science
Subjects
dc:subject × 2Rights
dc:rights- Language dc:language
- English, eng
Identifiers
dc:identifier.*- Repository record dc:identifier
- https://scholar.utc.edu/theses/360
- OAI identifier oai:identifier
- oai:scholar.utc.edu:theses-1500