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University of Ontario Institute of Technology

Investigating DC circuit breaker service life

Abstract

dc:description.abstract

This thesis investigates methods to extend the service life of DC circuit breakers using inductive voltage spike mitigation techniques aimed at reducing electric arcs during switching operations. Unlike AC systems, DC lacks a natural zero-crossing which results in large transient voltages that accelerate switch wear and reduce service life. A low-cost low-complexity RC circuit was designed using fundamental component equations and implemented in Simulink and in hardware revealing effective voltage spike reduction. Simulation predicted spike reduction from the megavolt range to approximately 110 V, while hardware results showed peak voltages reduced further to 40.1 V with strong repeatability. Switches were opened after further testing with and without the RC circuit active to show increased surface wear on the latter. Additional surge arresting MOV configurations were simulated at higher voltage levels, up to 500 kV. Findings demonstrate an effective and accessible method for improving DC system reliability.

Degree

thesis:*
Name thesis:degree_name
Master of Applied Science (MASc)
Discipline thesis:degree_discipline
Electrical and Computer Engineering
Grantor
University of Ontario Institute of Technology
Year dc:date.issued
2026

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Budhooram, Sean Dave
Advisors dc:contributor.advisor
  • Sidhu, Tarlochan
  • Sood, Vijay

Rights

Language dc:language.iso
en

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/10155/2102
OAI identifier oai:identifier
oai:ontariotechu.scholaris.ca:10155/2102

Chain of custody

source
Harvested from
Ontario Institute of Technology
Base URL
ontariotechu.scholaris.ca/server/oai/request
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
related terms
citation

Budhooram, Sean Dave. Investigating DC circuit breaker service life. University of Ontario Institute of Technology, 2026. https://hdl.handle.net/10155/2102