CT3 as an Index of Knowledge Domain Structure: Distributions for Order Analysis and Information Hierarchies

The problem with which this study is concerned is articulating all possible CT3 and KR21 reliability measures for every case of a 5x5 binary matrix (32,996,500 possible matrices). The study has three purposes. The first purpose is to calculate CT3 for every matrix and compare the results to the proposed optimum range of .3 to .5. The second purpose is to compare the results from the calculation of KR21 and CT3 reliability measures. The third purpose is to calculate CT3 and KR21 on every strand of a class test whose item set has been reduced using the difficulty strata identified by Order Analysis. The study was conducted by writing a computer program to articulate all possible 5 x 5 matrices. The program also calculated CT3 and KR21 reliability measures for each matrix. The nonparametric technique of Order Analysis was applied to two sections of test items to stratify the items into difficulty levels. The difficulty levels were used to reduce the item set from 22 to 9 items. All possible strands or chains of these items were identified so that both reliability measures (CT3 and KR21) could be calculated. One major finding of this study indicates that .3 to .5 is a desirable range for CT3 (cumulative p=.86 to p=.98) if cumulative frequencies are measured. A second major finding is that the KR21 reliability measure produced an invalid result more than half the time. The last major finding is that CT3, rescaled to range between 0 and 1, supports De Vellis' guidelines for reliability measures. The major conclusion is that CT3 is a better measure of reliability since it considers both inter- and intra-item variances.

Grantor dc:publisher

University of North Texas

Year dc:date

2002

Author dc:creator

• Swartz Horn, Rebecca

Contributors dc:contributor

• Knezek, Gerald
• Wallace, Susan
• Young, Jon I.
• O'Connor, Brian Clark

• Educational tests and measurements.
• Item response theory.
• CT3
• KR21
• reliability measures
• nonparametric
• reliability
• rder analysis

Statement dc:rights

• Public
• Copyright
• Swartz Horn, Rebecca
• Copyright is held by the author, unless otherwise noted. All rights reserved.

Language dc:language

English

Identifier

oclc: 52075723
https://digital.library.unt.edu/ark:/67531/metadc3306/
ark: ark:/67531/metadc3306

OAI identifier oai:identifier

info:ark/67531/metadc3306