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University of North Texas

Improved Fabrication and Quality Control of Substrate Integrated Microelectrode Arrays

Abstract

dc:description

Spontaneously active monolayer neuronal networks cultured on photoetched multimicroelectrode plates (MMEPs) offer great potential for use in studying neuronal networks. However, there are many problems associated with frequent, long-term use of MMEPs. The major problems include (1) polysiloxane insulation deterioration and breakdown, (2) and loss of gold at the gold electroplated indium-tin oxide (ITO) electrodes. The objective of this investigation was to correct these major problems. Quality control measures were employed to monitor MMEP fabrication variables. The phenotypes of polysiloxane degradation were identified and classified. Factors that were found to contribute most to insulation deterioration were (1) moisture contamination during MMEP insulation, (2) loss of the quartz barrier layer from excessive exposure to basic solutions, and (3) repetitive use in culture. As a result, the insulation equipment and methods were modified to control moisture-dependent insulation deterioration, and the KOH reprocessing solution was replaced with tetramethylguanidine to prevent damage to the quartz. The problems associated with gold electroplating were solved via the addition of a pulsed-DC application of gold in a new citrate buffered electroplating solution.

Degree

thesis:*
Grantor dc:publisher
University of North Texas
Year dc:date
2000

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Zim, Bret E.
Contributors dc:contributor
  • Gross, Guenter W.
  • Tam, David
  • Kelber, Jeffry A.

Subjects

dc:subject × 7

Rights

dc:rights
Statement dc:rights
  • Public
  • Copyright
  • Zim, Bret E.
  • Copyright is held by the author, unless otherwise noted. All rights reserved.
Language dc:language
English

Identifiers

dc:identifier.*
Identifier
oclc: 48933477
untcat: b2351938
https://digital.library.unt.edu/ark:/67531/metadc2484/
ark: ark:/67531/metadc2484
OAI identifier oai:identifier
info:ark/67531/metadc2484

Chain of custody

source
Harvested from
University of North Texas
Base URL
digital.library.unt.edu/oai/
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Zim, Bret E.. Improved Fabrication and Quality Control of Substrate Integrated Microelectrode Arrays. University of North Texas, 2000. https://doi.org/10.12794/metadc2484