Divergence Model for Measurement of Goos-Hanchen Shift

In this effort a new measurement technique for the lateral Goos-Hanchen shift is developed, analyzed, and demonstrated. The new technique uses classical image formation methods fused with modern detection and analysis methods to achieve higher levels of sensitivity than obtained with prior practice. Central to the effort is a new mathematical model of the dispersion seen at a step shadow when the Goos-Hanchen effect occurs near critical angle for total internal reflection. Image processing techniques are applied to measure the intensity distribution transfer function of a new divergence model of the Goos-Hanchen phenomena providing verification of the model. This effort includes mathematical modeling techniques, analytical derivations of governing equations, numerical verification of models and sensitivities, optical design of apparatus, image processing

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Year

2007

Author dc:creator

• Gray, Jeffrey Frank

Contributors dc:contributor

• Puri, Ashok; Charalampidis, Dimitrios
• Jilkov, Vesselin
• Alsamman, Abdul Rahman

• Goos-Hanchen
• total internal reflection
• evanescent waves
• image processing
• Canny filters
• sub-pixel
• Superresolution

Repository record dc:identifier

https://scholarworks.uno.edu/td/584

OAI identifier oai:identifier

oai:scholarworks.uno.edu:td-1584