Using current sensing atomic force microscopy to study heterogeneous materials

Two kinds of heterogeneous materials, block copolymer films and Nafion membranes, are studied by using current sensing atomic force microscopy (CSAFM). In the calculated results, correlation between surface morphology and surface conductance images is obtained using CSAFM, and the implication of the surface conductance and its variations is analyzed. It is found that if the diameter of the CSAFM probe tip is much smaller than the correlation length of the surface morphological features, the current sensing image obtained using the probe has little correlation with the surface morphology, and the current sensed by CSAFM indeed reflects the variation of local resistivity on the sample surface. In experimental results, the microphase separation of block copolymer and the current passing through the ion channel in Nafion membranes are observed by CSAFM. This demonstrates that CSAFM is a powerful and important tool for studying heterogeneous materials.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Physics (UMKC)

Grantor dc:publisher

University of Missouri--Kansas City

Year dc:date.issued

2012

Author dc:creator

• Liu, Yucong

Advisor dc:contributor.advisor

• Zhu, Da-Ming, 1957-

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10355/14950

OAI identifier oai:identifier

oai:mospace.umsystem.edu:10355/14950