{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/97788"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/97788","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Dynamic environmental transmission electron microscopy","abstract":"The development of a dynamic environmental transmission electron microscope (DETEM) at the University of Illinois Urbana Champaign is documented in this thesis. The proposed apparatus is the first of its kind, combining the power of high-resolution electron imaging and diffraction of TEM, the time resolution provided by pulsed laser, and the in-situ capabilities of environmental transmission electron microscopy (ETEM) while also providing fast imaging capability using a CMOS pixel sensor for direct electron detection and a photoelectron gun. When operated in continuous imaging mode, the time resolution of the DETEM will be at least a factor of 30 larger than conventional electron microscopes. With the pulsed laser, dynamic events of reversible and irreversible processes in materials can be imaged and recorded with either stroboscopic or single-shot movie-mode methods. To develop the DETEM the Hitachi H-9500 300 kV TEM installed at the Frederick Seitz Materials Research Laboratory, has been modified to accommodate the optics to allow various pump-probe methods to take place for in-situ experiments. The design and assembly of the pump and probe optical inserts are described, along with the optical layout and its alignment that delivers the pump and probe laser beams. Characterization of the nanosecond pulsed laser system being implemented for the DETEM and ex-situ measurements of power threshold were also performed and recorded.","abstract_html":"The development of a dynamic environmental transmission electron microscope (DETEM) at the University of Illinois Urbana Champaign is documented in this thesis. The proposed apparatus is the first of its kind, combining the power of high-resolution electron imaging and diffraction of TEM, the time resolution provided by pulsed laser, and the in-situ capabilities of environmental transmission electron microscopy (ETEM) while also providing fast imaging capability using a CMOS pixel sensor for direct electron detection and a photoelectron gun. When operated in continuous imaging mode, the time resolution of the DETEM will be at least a factor of 30 larger than conventional electron microscopes. With the pulsed laser, dynamic events of reversible and irreversible processes in materials can be imaged and recorded with either stroboscopic or single-shot movie-mode methods. To develop the DETEM the Hitachi H-9500 300 kV TEM installed at the Frederick Seitz Materials Research Laboratory, has been modified to accommodate the optics to allow various pump-probe methods to take place for in-situ experiments. The design and assembly of the pump and probe optical inserts are described, along with the optical layout and its alignment that delivers the pump and probe laser beams. Characterization of the nanosecond pulsed laser system being implemented for the DETEM and ex-situ measurements of power threshold were also performed and recorded.","abstract_has_math":false,"creators":["Lai, Jocelyn Chu"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Materials Science & Engr","degree_department":null,"school":null,"contributors":["Zuo, Jian Min","van der Veen, Renske"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2017,"date_issued":"2017-08-10T20:33:26Z","date_published":"2017-08-10T20:33:26Z","updated_at":"2026-07-22T22:24:34Z","subjects":["Transmission electron microscopy (TEM)","Dynamic environmental transmission electron microscopy (DETEM)","Dynamic transmission electron microscopy (DTEM)","Zuo","van der Veen","Electron microscopy"],"languages":["en"],"rights":["Copyright 2017 Jocelyn Lai"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/97788","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Zuo, Jian Min","van der Veen, Renske"]},{"key":"dc:creator","label":"Author","values":["Lai, Jocelyn Chu"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2017-08-10T20:33:26Z","2019-08-11T09:15:32Z","2017-04-26","2017-05"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science & Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Transmission electron microscopy (TEM)","Dynamic environmental transmission electron microscopy (DETEM)","Dynamic transmission electron microscopy (DTEM)","Zuo","van der Veen","Electron microscopy"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2017 Jocelyn Lai"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/97788"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The development of a dynamic environmental transmission electron microscope (DETEM) at the University of Illinois Urbana Champaign is documented in this thesis. The proposed apparatus is the first of its kind, combining the power of high-resolution electron imaging and diffraction of TEM, the time resolution provided by pulsed laser, and the in-situ capabilities of environmental transmission electron microscopy (ETEM) while also providing fast imaging capability using a CMOS pixel sensor for direct electron detection and a photoelectron gun. When operated in continuous imaging mode, the time resolution of the DETEM will be at least a factor of 30 larger than conventional electron microscopes. With the pulsed laser, dynamic events of reversible and irreversible processes in materials can be imaged and recorded with either stroboscopic or single-shot movie-mode methods. To develop the DETEM the Hitachi H-9500 300 kV TEM installed at the Frederick Seitz Materials Research Laboratory, has been modified to accommodate the optics to allow various pump-probe methods to take place for in-situ experiments. The design and assembly of the pump and probe optical inserts are described, along with the optical layout and its alignment that delivers the pump and probe laser beams. Characterization of the nanosecond pulsed laser system being implemented for the DETEM and ex-situ measurements of power threshold were also performed and recorded.","Submission published under a 24 month embargo labeled 'U of I Access', the embargo will last until 2019-05-01","The student, Jocelyn Lai, accepted the attached license on 2017-04-25 at 16:37.","The student, Jocelyn Lai, submitted this Thesis for approval on 2017-04-25 at 16:50.","This Thesis was approved for publication on 2017-04-26 at 18:19.","DSpace SAF Submission Ingestion Package generated from Vireo submission #11065 on 2017-08-10 at 15:07:06","Made available in DSpace on 2017-08-10T20:33:26Z (GMT). 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The proposed apparatus is the first of its kind, combining the power of high-resolution electron imaging and diffraction of TEM, the time resolution provided by pulsed laser, and the in-situ capabilities of environmental transmission electron microscopy (ETEM) while also providing fast imaging capability using a CMOS pixel sensor for direct electron detection and a photoelectron gun. When operated in continuous imaging mode, the time resolution of the DETEM will be at least a factor of 30 larger than conventional electron microscopes. With the pulsed laser, dynamic events of reversible and irreversible processes in materials can be imaged and recorded with either stroboscopic or single-shot movie-mode methods. To develop the DETEM the Hitachi H-9500 300 kV TEM installed at the Frederick Seitz Materials Research Laboratory, has been modified to accommodate the optics to allow various pump-probe methods to take place for in-situ experiments. The design and assembly of the pump and probe optical inserts are described, along with the optical layout and its alignment that delivers the pump and probe laser beams. Characterization of the nanosecond pulsed laser system being implemented for the DETEM and ex-situ measurements of power threshold were also performed and recorded.","Submission published under a 24 month embargo labeled 'U of I Access', the embargo will last until 2019-05-01","The student, Jocelyn Lai, accepted the attached license on 2017-04-25 at 16:37.","The student, Jocelyn Lai, submitted this Thesis for approval on 2017-04-25 at 16:50.","This Thesis was approved for publication on 2017-04-26 at 18:19.","DSpace SAF Submission Ingestion Package generated from Vireo submission #11065 on 2017-08-10 at 15:07:06","Made available in DSpace on 2017-08-10T20:33:26Z (GMT). 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