{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/87696"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/87696","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Stress and Orientation Effects in Ferroelectric Thin Films","abstract":"U of I Only","abstract_html":"U of I Only","abstract_has_math":false,"creators":["Lian, Lei"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Theoretical and Applied Mechanics","degree_department":null,"school":null,"contributors":["Sottos, Nancy R."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-28T16:23:30Z","date_published":"2015-09-28T16:23:30Z","updated_at":"2026-07-22T22:26:30Z","subjects":["Engineering, Materials Science"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3017146"],"render_values":[{"text":"(MiAaPQ)AAI3017146","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/87696","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Sottos, Nancy R."]},{"key":"dc:creator","label":"Author","values":["Lian, Lei"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-28T16:23:30Z","10000-01-01","2001"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Theoretical and Applied Mechanics"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/87696","(MiAaPQ)AAI3017146"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["U of I Only","139 p.","The effects of stress on the response of ferroelectric thin films are measured directly by a beam bending experiment in a unique double-beam laser interferometer. Application of a compressive bending stress to relieve the tensile residual stress in PZT (52/48) film increases the field-induced strains. The opposite effect is observed for application of a tensile stress. To gain further insight into these observations, a previously developed micro-electro-mechanical model is applied to numerically simulate the response of ferroelectrics under a general state of stress and electric field. Material parameters obtained by fitting simulation results with available experimental data are used to predict effects of the preferred crystallographic orientation and biaxial tensile stress applied transverse to the poling direction. The simulation results are consistent with experimental observations of the preferred orientation and stress effects in PZT (52/48) thin films.","Made available in DSpace on 2015-09-28T16:23:30Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3017146.pdf: 5671073 bytes, checksum: edd01f36ecd9dff6ff02ca0a47e84e13 (MD5) Previous issue date: 2001","Embargo set by: Seth Robbins for item 88977 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001."]},{"key":"dc:title","label":"Title","values":["Stress and Orientation Effects in Ferroelectric Thin Films"]}]}],"canonical_facts":{"dc:contributor":["Sottos, Nancy R."],"dc:creator":["Lian, Lei"],"dc:date":["2015-09-28T16:23:30Z","10000-01-01","2001"],"dc:description":["U of I Only","139 p.","The effects of stress on the response of ferroelectric thin films are measured directly by a beam bending experiment in a unique double-beam laser interferometer. Application of a compressive bending stress to relieve the tensile residual stress in PZT (52/48) film increases the field-induced strains. The opposite effect is observed for application of a tensile stress. To gain further insight into these observations, a previously developed micro-electro-mechanical model is applied to numerically simulate the response of ferroelectrics under a general state of stress and electric field. Material parameters obtained by fitting simulation results with available experimental data are used to predict effects of the preferred crystallographic orientation and biaxial tensile stress applied transverse to the poling direction. The simulation results are consistent with experimental observations of the preferred orientation and stress effects in PZT (52/48) thin films.","Made available in DSpace on 2015-09-28T16:23:30Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3017146.pdf: 5671073 bytes, checksum: edd01f36ecd9dff6ff02ca0a47e84e13 (MD5) Previous issue date: 2001","Embargo set by: Seth Robbins for item 88977 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001."],"dc:identifier":["http://hdl.handle.net/2142/87696","(MiAaPQ)AAI3017146"],"dc:language":["eng"],"dc:subject":["Engineering, Materials Science"],"dc:title":["Stress and Orientation Effects in Ferroelectric Thin Films"],"dc:type":["text"],"thesis:degree_discipline":["Theoretical and Applied Mechanics"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:30Z"}