{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/83864"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/83864","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Synthesis of Metal Nanowires Using Nanocracks and Dna-Templates and Their Characterization","abstract":"An alternate nanowire fabrication technique that simplifies their testing by enabling their direct integration with MEMS test-beds has also been presented. In this approach, commercially available lambda DNA's (16.1 microns long and 2 nm wide) are used as templates to form nanowires of various metals through sputter deposition or evaporation. The test-bed is compatible with commercially available TEM stages for conducting in situ nanostructural observations during annealing. In situ analyses revealed grain growth in gold and nickel nanowires, whereas aluminum nanowires, contrary to conventional wisdom, showed no grain growth even until melting. The absence of grain growth in aluminum can be attributed to the presence of more grain boundary impurities and an oxide layer that inhibit grain boundary migration and consequently grain growth.","abstract_html":"An alternate nanowire fabrication technique that simplifies their testing by enabling their direct integration with MEMS test-beds has also been presented. In this approach, commercially available lambda DNA&#x27;s (16.1 microns long and 2 nm wide) are used as templates to form nanowires of various metals through sputter deposition or evaporation. The test-bed is compatible with commercially available TEM stages for conducting in situ nanostructural observations during annealing. In situ analyses revealed grain growth in gold and nickel nanowires, whereas aluminum nanowires, contrary to conventional wisdom, showed no grain growth even until melting. The absence of grain growth in aluminum can be attributed to the presence of more grain boundary impurities and an oxide layer that inhibit grain boundary migration and consequently grain growth.","abstract_has_math":false,"creators":["Mani, Sathyanarayanan"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Mechanical Engineering","degree_department":null,"school":null,"contributors":["Taher Saif"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T21:12:30Z","date_published":"2015-09-25T21:12:30Z","updated_at":"2026-07-22T22:26:22Z","subjects":["Engineering, Materials Science"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3250285"],"render_values":[{"text":"(MiAaPQ)AAI3250285","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/83864","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Taher Saif"]},{"key":"dc:creator","label":"Author","values":["Mani, Sathyanarayanan"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T21:12:30Z","10000-01-01","2006"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Mechanical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/83864","(MiAaPQ)AAI3250285"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["An alternate nanowire fabrication technique that simplifies their testing by enabling their direct integration with MEMS test-beds has also been presented. In this approach, commercially available lambda DNA's (16.1 microns long and 2 nm wide) are used as templates to form nanowires of various metals through sputter deposition or evaporation. The test-bed is compatible with commercially available TEM stages for conducting in situ nanostructural observations during annealing. In situ analyses revealed grain growth in gold and nickel nanowires, whereas aluminum nanowires, contrary to conventional wisdom, showed no grain growth even until melting. The absence of grain growth in aluminum can be attributed to the presence of more grain boundary impurities and an oxide layer that inhibit grain boundary migration and consequently grain growth.","Made available in DSpace on 2015-09-25T21:12:30Z (GMT). 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In this approach, commercially available lambda DNA's (16.1 microns long and 2 nm wide) are used as templates to form nanowires of various metals through sputter deposition or evaporation. The test-bed is compatible with commercially available TEM stages for conducting in situ nanostructural observations during annealing. In situ analyses revealed grain growth in gold and nickel nanowires, whereas aluminum nanowires, contrary to conventional wisdom, showed no grain growth even until melting. The absence of grain growth in aluminum can be attributed to the presence of more grain boundary impurities and an oxide layer that inhibit grain boundary migration and consequently grain growth.","Made available in DSpace on 2015-09-25T21:12:30Z (GMT). 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