{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/82785"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/82785","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Structure and Phase Transformation of Nanocrystalline and Amorphous Alloy Thin Films","abstract":"The systematic study on the structure and morphology of Ag-Si alloy thin films shows nanocrystalline Ag clusters embedded in amorphous Si matrix for samples of different compositions and thicknesses. Ag cluster sizes increase from 2.5 nm to 3.5 nm as annealing temperature increases from room temperature to 500°C, and the cluster densities decrease accordingly from 2.5x10 4/mum2 to 7.6x103/mum 2. This phenomenon can be explained by grain growth and Ostwald ripening in which big clusters grows bigger at the expense of smaller clusters. The Ag clusters remain relatively stable under annealing; HREM images show crystalline structure at 500°C, which is different from Ag clusters supported on other substrates. TEM observation shows that Ag clusters are embedded inside the amorphous Si matrix, which explains their relative stability at high temperatures.","abstract_html":"The systematic study on the structure and morphology of Ag-Si alloy thin films shows nanocrystalline Ag clusters embedded in amorphous Si matrix for samples of different compositions and thicknesses. Ag cluster sizes increase from 2.5 nm to 3.5 nm as annealing temperature increases from room temperature to 500°C, and the cluster densities decrease accordingly from 2.5x10 4/mum2 to 7.6x103/mum 2. This phenomenon can be explained by grain growth and Ostwald ripening in which big clusters grows bigger at the expense of smaller clusters. The Ag clusters remain relatively stable under annealing; HREM images show crystalline structure at 500°C, which is different from Ag clusters supported on other substrates. TEM observation shows that Ag clusters are embedded inside the amorphous Si matrix, which explains their relative stability at high temperatures.","abstract_has_math":false,"creators":["Chen, Hao"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Materials Science and Engineering","degree_department":null,"school":null,"contributors":["Zuo, Jian-Min"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:53:01Z","date_published":"2015-09-25T20:53:01Z","updated_at":"2026-07-22T22:26:18Z","subjects":["Engineering, Metallurgy"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3242814"],"render_values":[{"text":"(MiAaPQ)AAI3242814","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/82785","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Zuo, Jian-Min"]},{"key":"dc:creator","label":"Author","values":["Chen, Hao"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:53:01Z","10000-01-01","2006"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science and Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Metallurgy"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/82785","(MiAaPQ)AAI3242814"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The systematic study on the structure and morphology of Ag-Si alloy thin films shows nanocrystalline Ag clusters embedded in amorphous Si matrix for samples of different compositions and thicknesses. Ag cluster sizes increase from 2.5 nm to 3.5 nm as annealing temperature increases from room temperature to 500°C, and the cluster densities decrease accordingly from 2.5x10 4/mum2 to 7.6x103/mum 2. This phenomenon can be explained by grain growth and Ostwald ripening in which big clusters grows bigger at the expense of smaller clusters. The Ag clusters remain relatively stable under annealing; HREM images show crystalline structure at 500°C, which is different from Ag clusters supported on other substrates. TEM observation shows that Ag clusters are embedded inside the amorphous Si matrix, which explains their relative stability at high temperatures.","Made available in DSpace on 2015-09-25T20:53:01Z (GMT). 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Ag cluster sizes increase from 2.5 nm to 3.5 nm as annealing temperature increases from room temperature to 500°C, and the cluster densities decrease accordingly from 2.5x10 4/mum2 to 7.6x103/mum 2. This phenomenon can be explained by grain growth and Ostwald ripening in which big clusters grows bigger at the expense of smaller clusters. The Ag clusters remain relatively stable under annealing; HREM images show crystalline structure at 500°C, which is different from Ag clusters supported on other substrates. TEM observation shows that Ag clusters are embedded inside the amorphous Si matrix, which explains their relative stability at high temperatures.","Made available in DSpace on 2015-09-25T20:53:01Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3242814.pdf: 3815145 bytes, checksum: 9e95e8982e376d79a49e3e99bbb97829 (MD5) Previous issue date: 2006","Embargo set by: Seth Robbins for item 84066 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","115 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006."],"dc:identifier":["http://hdl.handle.net/2142/82785","(MiAaPQ)AAI3242814"],"dc:language":["eng"],"dc:subject":["Engineering, Metallurgy"],"dc:title":["Structure and Phase Transformation of Nanocrystalline and Amorphous Alloy Thin Films"],"dc:type":["text"],"thesis:degree_discipline":["Materials Science and Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:18Z"}