{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/82784"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/82784","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Origins of Enhanced Dielectric Properties in Titania-Modified Tantalum Pentoxide Ceramics","abstract":"Dense and homogeneous specimens enabled the first detailed investigation into the electrical properties of TiO2-modified H-Ta2O 5 ceramics. Specimens containing 8% TiO2 exhibited dielectric constant (K) values of &sim;280 at 20&deg;C with tan delta values &sim;0.01, but undoped specimens had tan delta values of &sim;0.10 and DC resistivity values of <1011O&middot;cm. Hyper-Raman spectroscopy revealed that the ionic polarizability (and thus the intrinsic K) of H-Ta 2O5 ceramics was independent of TiO2 content. Cryogenic electrical measurements suggested that the structural K &ap; 70-80, and showed that enhanced K values resulted from localized carriers related to compensation for deviations from the fully-edge-shared 89Ta2O 5-11TiO2 composition.","abstract_html":"Dense and homogeneous specimens enabled the first detailed investigation into the electrical properties of TiO2-modified H-Ta2O 5 ceramics. Specimens containing 8% TiO2 exhibited dielectric constant (K) values of &amp;sim;280 at 20&amp;deg;C with tan delta values &amp;sim;0.01, but undoped specimens had tan delta values of &amp;sim;0.10 and DC resistivity values of &lt;1011O&amp;middot;cm. Hyper-Raman spectroscopy revealed that the ionic polarizability (and thus the intrinsic K) of H-Ta 2O5 ceramics was independent of TiO2 content. Cryogenic electrical measurements suggested that the structural K &amp;ap; 70-80, and showed that enhanced K values resulted from localized carriers related to compensation for deviations from the fully-edge-shared 89Ta2O 5-11TiO2 composition.","abstract_has_math":false,"creators":["Brennecka, Geoffrey Lee"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Materials Science and Engineering","degree_department":null,"school":null,"contributors":["Payne, David A."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:53:00Z","date_published":"2015-09-25T20:53:00Z","updated_at":"2026-07-22T22:26:18Z","subjects":["Engineering, Materials Science"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3242800"],"render_values":[{"text":"(MiAaPQ)AAI3242800","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/82784","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Payne, David A."]},{"key":"dc:creator","label":"Author","values":["Brennecka, Geoffrey Lee"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:53:00Z","10000-01-01","2006"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science and Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/82784","(MiAaPQ)AAI3242800"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Dense and homogeneous specimens enabled the first detailed investigation into the electrical properties of TiO2-modified H-Ta2O 5 ceramics. Specimens containing 8% TiO2 exhibited dielectric constant (K) values of &sim;280 at 20&deg;C with tan delta values &sim;0.01, but undoped specimens had tan delta values of &sim;0.10 and DC resistivity values of <1011O&middot;cm. Hyper-Raman spectroscopy revealed that the ionic polarizability (and thus the intrinsic K) of H-Ta 2O5 ceramics was independent of TiO2 content. Cryogenic electrical measurements suggested that the structural K &ap; 70-80, and showed that enhanced K values resulted from localized carriers related to compensation for deviations from the fully-edge-shared 89Ta2O 5-11TiO2 composition.","Made available in DSpace on 2015-09-25T20:53:00Z (GMT). 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Specimens containing 8% TiO2 exhibited dielectric constant (K) values of &sim;280 at 20&deg;C with tan delta values &sim;0.01, but undoped specimens had tan delta values of &sim;0.10 and DC resistivity values of <1011O&middot;cm. Hyper-Raman spectroscopy revealed that the ionic polarizability (and thus the intrinsic K) of H-Ta 2O5 ceramics was independent of TiO2 content. Cryogenic electrical measurements suggested that the structural K &ap; 70-80, and showed that enhanced K values resulted from localized carriers related to compensation for deviations from the fully-edge-shared 89Ta2O 5-11TiO2 composition.","Made available in DSpace on 2015-09-25T20:53:00Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3242800.pdf: 8972021 bytes, checksum: 99e402e375e6197821ffe2a93d72ce38 (MD5) Previous issue date: 2006","Embargo set by: Seth Robbins for item 84065 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","268 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006."],"dc:identifier":["http://hdl.handle.net/2142/82784","(MiAaPQ)AAI3242800"],"dc:language":["eng"],"dc:subject":["Engineering, Materials Science"],"dc:title":["Origins of Enhanced Dielectric Properties in Titania-Modified Tantalum Pentoxide Ceramics"],"dc:type":["text"],"thesis:degree_discipline":["Materials Science and Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:18Z"}