{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/82700"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/82700","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Remote Plasma Chemical Vapor Deposition of Zirconium Boride: Growth and Diffusion Barrier Characteristics","abstract":"High-quality ZrB2 thin films have been deposited at substrate temperatures as low as 300&deg;C by a new method: remote hydrogen plasma chemical vapor deposition from the single-source precursor zirconium borohydride, Zr(BH 4)4. Carrying out the deposition in the presence of atomic hydrogen generates films with properties that are far superior to those deposited by purely thermal methods; the latter are boron-rich, oxidize readily in air, and adhere poorly to the substrates. In contrast, the films generated at a substrate temperature of 300&deg;C in the presence of atomic H have a B/Zr ratio of 2, a resistivity of 40 muO-cm, an oxygen content of &le;4 atomic % and are fully conformal in deep vias. A 20 nm thick amorphous film of ZrB2 on c-Si(001) prevents Cu indiffusion after 30 min at 750&deg;C. We propose that the beneficial effects of atomic hydrogen can be attributed largely to promoting the desorption of diborane from the growth surface.","abstract_html":"High-quality ZrB2 thin films have been deposited at substrate temperatures as low as 300&amp;deg;C by a new method: remote hydrogen plasma chemical vapor deposition from the single-source precursor zirconium borohydride, Zr(BH 4)4. Carrying out the deposition in the presence of atomic hydrogen generates films with properties that are far superior to those deposited by purely thermal methods; the latter are boron-rich, oxidize readily in air, and adhere poorly to the substrates. In contrast, the films generated at a substrate temperature of 300&amp;deg;C in the presence of atomic H have a B/Zr ratio of 2, a resistivity of 40 muO-cm, an oxygen content of &amp;le;4 atomic % and are fully conformal in deep vias. A 20 nm thick amorphous film of ZrB2 on c-Si(001) prevents Cu indiffusion after 30 min at 750&amp;deg;C. We propose that the beneficial effects of atomic hydrogen can be attributed largely to promoting the desorption of diborane from the growth surface.","abstract_has_math":false,"creators":["Sung, Junghwan"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Materials Science and Engineering","degree_department":null,"school":null,"contributors":["Abelson, John R."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:52:32Z","date_published":"2015-09-25T20:52:32Z","updated_at":"2026-07-22T22:26:18Z","subjects":["Engineering, Materials Science"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3017224"],"render_values":[{"text":"(MiAaPQ)AAI3017224","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/82700","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Abelson, John R."]},{"key":"dc:creator","label":"Author","values":["Sung, Junghwan"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:52:32Z","10000-01-01","2001"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science and Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/82700","(MiAaPQ)AAI3017224"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["High-quality ZrB2 thin films have been deposited at substrate temperatures as low as 300&deg;C by a new method: remote hydrogen plasma chemical vapor deposition from the single-source precursor zirconium borohydride, Zr(BH 4)4. Carrying out the deposition in the presence of atomic hydrogen generates films with properties that are far superior to those deposited by purely thermal methods; the latter are boron-rich, oxidize readily in air, and adhere poorly to the substrates. In contrast, the films generated at a substrate temperature of 300&deg;C in the presence of atomic H have a B/Zr ratio of 2, a resistivity of 40 muO-cm, an oxygen content of &le;4 atomic % and are fully conformal in deep vias. A 20 nm thick amorphous film of ZrB2 on c-Si(001) prevents Cu indiffusion after 30 min at 750&deg;C. We propose that the beneficial effects of atomic hydrogen can be attributed largely to promoting the desorption of diborane from the growth surface.","Made available in DSpace on 2015-09-25T20:52:32Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3017224.pdf: 2490136 bytes, checksum: 215b559ffd04be2097a5304db593899a (MD5) Previous issue date: 2001","Embargo set by: Seth Robbins for item 83981 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","78 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001."]},{"key":"dc:title","label":"Title","values":["Remote Plasma Chemical Vapor Deposition of Zirconium Boride: Growth and Diffusion Barrier Characteristics"]}]}],"canonical_facts":{"dc:contributor":["Abelson, John R."],"dc:creator":["Sung, Junghwan"],"dc:date":["2015-09-25T20:52:32Z","10000-01-01","2001"],"dc:description":["High-quality ZrB2 thin films have been deposited at substrate temperatures as low as 300&deg;C by a new method: remote hydrogen plasma chemical vapor deposition from the single-source precursor zirconium borohydride, Zr(BH 4)4. Carrying out the deposition in the presence of atomic hydrogen generates films with properties that are far superior to those deposited by purely thermal methods; the latter are boron-rich, oxidize readily in air, and adhere poorly to the substrates. In contrast, the films generated at a substrate temperature of 300&deg;C in the presence of atomic H have a B/Zr ratio of 2, a resistivity of 40 muO-cm, an oxygen content of &le;4 atomic % and are fully conformal in deep vias. A 20 nm thick amorphous film of ZrB2 on c-Si(001) prevents Cu indiffusion after 30 min at 750&deg;C. We propose that the beneficial effects of atomic hydrogen can be attributed largely to promoting the desorption of diborane from the growth surface.","Made available in DSpace on 2015-09-25T20:52:32Z (GMT). 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