{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/81340"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/81340","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Minority Electron Base Transport in Heterojunction Bipolar Transistors Determined by Magneto-Transport Measurements","abstract":"The magneto-transport method is a technique that allows the simultaneous measurement of the minority electron mobility in the base of the HBT and the dc current gain of the device. The minority electron lifetime can be determined using these two measurements. Therefore, this technique is very valuable for its ability to characterize the quality of the base material in terms of the minority electron's mobility and lifetime. In this dissertation, results performed using the magneto-transport method are used to study the electron mobility and lifetime in HBTs.","abstract_html":"The magneto-transport method is a technique that allows the simultaneous measurement of the minority electron mobility in the base of the HBT and the dc current gain of the device. The minority electron lifetime can be determined using these two measurements. Therefore, this technique is very valuable for its ability to characterize the quality of the base material in terms of the minority electron&#x27;s mobility and lifetime. In this dissertation, results performed using the magneto-transport method are used to study the electron mobility and lifetime in HBTs.","abstract_has_math":false,"creators":["Miller, John Gregory"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":["Stillman, Gregory E."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:10:39Z","date_published":"2015-09-25T20:10:39Z","updated_at":"2026-07-22T22:26:16Z","subjects":["Engineering, Electronics and Electrical"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI9971139"],"render_values":[{"text":"(MiAaPQ)AAI9971139","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/81340","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Stillman, Gregory E."]},{"key":"dc:creator","label":"Author","values":["Miller, John Gregory"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:10:39Z","10000-01-01","2000"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/81340","(MiAaPQ)AAI9971139"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The magneto-transport method is a technique that allows the simultaneous measurement of the minority electron mobility in the base of the HBT and the dc current gain of the device. The minority electron lifetime can be determined using these two measurements. Therefore, this technique is very valuable for its ability to characterize the quality of the base material in terms of the minority electron's mobility and lifetime. In this dissertation, results performed using the magneto-transport method are used to study the electron mobility and lifetime in HBTs.","Made available in DSpace on 2015-09-25T20:10:39Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9971139.pdf: 3552259 bytes, checksum: c44e65c9467736090165ceeb0f3ceabb (MD5) Previous issue date: 2000","Embargo set by: Seth Robbins for item 82621 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","67 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000."]},{"key":"dc:title","label":"Title","values":["Minority Electron Base Transport in Heterojunction Bipolar Transistors Determined by Magneto-Transport Measurements"]}]}],"canonical_facts":{"dc:contributor":["Stillman, Gregory E."],"dc:creator":["Miller, John Gregory"],"dc:date":["2015-09-25T20:10:39Z","10000-01-01","2000"],"dc:description":["The magneto-transport method is a technique that allows the simultaneous measurement of the minority electron mobility in the base of the HBT and the dc current gain of the device. The minority electron lifetime can be determined using these two measurements. Therefore, this technique is very valuable for its ability to characterize the quality of the base material in terms of the minority electron's mobility and lifetime. In this dissertation, results performed using the magneto-transport method are used to study the electron mobility and lifetime in HBTs.","Made available in DSpace on 2015-09-25T20:10:39Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9971139.pdf: 3552259 bytes, checksum: c44e65c9467736090165ceeb0f3ceabb (MD5) Previous issue date: 2000","Embargo set by: Seth Robbins for item 82621 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","67 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000."],"dc:identifier":["http://hdl.handle.net/2142/81340","(MiAaPQ)AAI9971139"],"dc:language":["eng"],"dc:subject":["Engineering, Electronics and Electrical"],"dc:title":["Minority Electron Base Transport in Heterojunction Bipolar Transistors Determined by Magneto-Transport Measurements"],"dc:type":["text"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:16Z"}