Microplasma Transistor With Quasi Metal-Oxide-Semiconductor (mos)/metal-Insulator-Metal (Mim) Electron Emitters
Modeling of these devices entailed solving the differential form of Poisson's equation, subject to particle flux continuity of the cathode. Comparison of the model predictions with experimental estimates of the sheath potential shows agreement between the two to within 5% over the entire range in voltage investigated. This simulation, in tandem with the measured sheath potential, provides a new probeless method to determine the electron density at the sheath edge.
University of Illinois - Urbana-Champaign
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University of Illinois at Urbana-Champaign