{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/80891"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/80891","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Electrostatic Discharge Protection and Measurement Techniques for Radio Frequency Integrated Circuits","abstract":"In this research, ESD measurement techniques are also addressed. Two conventional ESD measurement systems are modified to improve the measurement capability for RF circuit characterization. One of the new measurement systems is capable of detecting ESD failures in RF circuits with an improved sensitivity. The second new measurement system has a significantly higher measurement bandwidth and dynamic range, improving the characterization ESD protection devices used to protect against very fast ESD events.","abstract_html":"In this research, ESD measurement techniques are also addressed. Two conventional ESD measurement systems are modified to improve the measurement capability for RF circuit characterization. One of the new measurement systems is capable of detecting ESD failures in RF circuits with an improved sensitivity. The second new measurement system has a significantly higher measurement bandwidth and dynamic range, improving the characterization ESD protection devices used to protect against very fast ESD events.","abstract_has_math":false,"creators":["Hyvonen, Sami Rikhard"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:08:40Z","date_published":"2015-09-25T20:08:40Z","updated_at":"2026-07-22T22:26:15Z","subjects":["Engineering, Electronics and Electrical"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI3160896"],"render_values":[{"text":"(MiAaPQ)AAI3160896","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/80891","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Hyvonen, Sami Rikhard"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:08:40Z","10000-01-01","2004"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/80891","(MiAaPQ)AAI3160896"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["In this research, ESD measurement techniques are also addressed. Two conventional ESD measurement systems are modified to improve the measurement capability for RF circuit characterization. One of the new measurement systems is capable of detecting ESD failures in RF circuits with an improved sensitivity. The second new measurement system has a significantly higher measurement bandwidth and dynamic range, improving the characterization ESD protection devices used to protect against very fast ESD events.","Made available in DSpace on 2015-09-25T20:08:40Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3160896.pdf: 12008000 bytes, checksum: 7579faf0bde594ada499affe722f81b4 (MD5) Previous issue date: 2004","Embargo set by: Seth Robbins for item 82173 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","151 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004."]},{"key":"dc:title","label":"Title","values":["Electrostatic Discharge Protection and Measurement Techniques for Radio Frequency Integrated Circuits"]}]}],"canonical_facts":{"dc:contributor":["Rosenbaum, Elyse"],"dc:creator":["Hyvonen, Sami Rikhard"],"dc:date":["2015-09-25T20:08:40Z","10000-01-01","2004"],"dc:description":["In this research, ESD measurement techniques are also addressed. Two conventional ESD measurement systems are modified to improve the measurement capability for RF circuit characterization. One of the new measurement systems is capable of detecting ESD failures in RF circuits with an improved sensitivity. The second new measurement system has a significantly higher measurement bandwidth and dynamic range, improving the characterization ESD protection devices used to protect against very fast ESD events.","Made available in DSpace on 2015-09-25T20:08:40Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3160896.pdf: 12008000 bytes, checksum: 7579faf0bde594ada499affe722f81b4 (MD5) Previous issue date: 2004","Embargo set by: Seth Robbins for item 82173 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","151 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004."],"dc:identifier":["http://hdl.handle.net/2142/80891","(MiAaPQ)AAI3160896"],"dc:language":["eng"],"dc:subject":["Engineering, Electronics and Electrical"],"dc:title":["Electrostatic Discharge Protection and Measurement Techniques for Radio Frequency Integrated Circuits"],"dc:type":["text"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:15Z"}