{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/80692"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/80692","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Transport Properties and Noise of Low -Dimensional Conductors","abstract":"In the second part, the frequency dependence of conductance and Johnson-Nyquist noise is calculated for one-dimensional wires and two-dimensional films. In low-dimensional conductors, collective effects become important even at low frequencies and lead to the predicted novel effects. Two different ways to derive the spectrum of charge fluctuations are demonstrated. Certain frequency dependencies of noise and conductance for one-dimensional wires and two-dimensional films, which can be subjected to experimental test, are predicted.","abstract_html":"In the second part, the frequency dependence of conductance and Johnson-Nyquist noise is calculated for one-dimensional wires and two-dimensional films. In low-dimensional conductors, collective effects become important even at low frequencies and lead to the predicted novel effects. Two different ways to derive the spectrum of charge fluctuations are demonstrated. Certain frequency dependencies of noise and conductance for one-dimensional wires and two-dimensional films, which can be subjected to experimental test, are predicted.","abstract_has_math":false,"creators":["Turlakov, Michael A."],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Physics","degree_department":null,"school":null,"contributors":["Leggett, Anthony J."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2015,"date_issued":"2015-09-25T20:03:38Z","date_published":"2015-09-25T20:03:38Z","updated_at":"2026-07-22T22:26:14Z","subjects":["Engineering, Electronics and Electrical"],"languages":["eng"],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(MiAaPQ)AAI9990173"],"render_values":[{"text":"(MiAaPQ)AAI9990173","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/80692","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Leggett, Anthony J."]},{"key":"dc:creator","label":"Author","values":["Turlakov, Michael A."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2015-09-25T20:03:38Z","10000-01-01","2000"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Physics"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/80692","(MiAaPQ)AAI9990173"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["In the second part, the frequency dependence of conductance and Johnson-Nyquist noise is calculated for one-dimensional wires and two-dimensional films. In low-dimensional conductors, collective effects become important even at low frequencies and lead to the predicted novel effects. Two different ways to derive the spectrum of charge fluctuations are demonstrated. Certain frequency dependencies of noise and conductance for one-dimensional wires and two-dimensional films, which can be subjected to experimental test, are predicted.","Made available in DSpace on 2015-09-25T20:03:38Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9990173.pdf: 4842875 bytes, checksum: 64acd2f567ffc76195ae89486288ea40 (MD5) Previous issue date: 2000","Embargo set by: Seth Robbins for item 81974 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","91 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000."]},{"key":"dc:title","label":"Title","values":["Transport Properties and Noise of Low -Dimensional Conductors"]}]}],"canonical_facts":{"dc:contributor":["Leggett, Anthony J."],"dc:creator":["Turlakov, Michael A."],"dc:date":["2015-09-25T20:03:38Z","10000-01-01","2000"],"dc:description":["In the second part, the frequency dependence of conductance and Johnson-Nyquist noise is calculated for one-dimensional wires and two-dimensional films. In low-dimensional conductors, collective effects become important even at low frequencies and lead to the predicted novel effects. Two different ways to derive the spectrum of charge fluctuations are demonstrated. Certain frequency dependencies of noise and conductance for one-dimensional wires and two-dimensional films, which can be subjected to experimental test, are predicted.","Made available in DSpace on 2015-09-25T20:03:38Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9990173.pdf: 4842875 bytes, checksum: 64acd2f567ffc76195ae89486288ea40 (MD5) Previous issue date: 2000","Embargo set by: Seth Robbins for item 81974 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","91 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000."],"dc:identifier":["http://hdl.handle.net/2142/80692","(MiAaPQ)AAI9990173"],"dc:language":["eng"],"dc:subject":["Engineering, Electronics and Electrical"],"dc:title":["Transport Properties and Noise of Low -Dimensional Conductors"],"dc:type":["text"],"thesis:degree_discipline":["Physics"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:14Z"}