{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/71997"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/71997","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Monte Carlo Methods for Reliability Analysis and Power Estimation","abstract":"Estimating the power dissipated during normal operating conditions is a major concern in the design of integrated circuits. Since excessive power dissipation causes overheating and can lead to soft errors and permanent damage, attempts to achieve first-pass reliability require accurate and efficient power estimation. With today's closer customer interaction, many circuits are being designed for already existing systems or for systems that are being concurrently designed. Accurate and efficient power estimation methods are needed to allow such close interaction.","abstract_html":"Estimating the power dissipated during normal operating conditions is a major concern in the design of integrated circuits. Since excessive power dissipation causes overheating and can lead to soft errors and permanent damage, attempts to achieve first-pass reliability require accurate and efficient power estimation. With today's closer customer interaction, many circuits are being designed for already existing systems or for systems that are being concurrently designed. Accurate and efficient power estimation methods are needed to allow such close interaction.","abstract_has_math":false,"creators":["Burch, Richard Gene"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":["Trick, Timothy N."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2014,"date_issued":"2014-12-16T22:23:09Z","date_published":"2014-12-16T22:23:09Z","updated_at":"2026-07-22T22:26:06Z","subjects":["Engineering, Electronics and Electrical"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(UMI)AAI9328982"],"render_values":[{"text":"(UMI)AAI9328982","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/71997","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Trick, Timothy N."]},{"key":"dc:creator","label":"Author","values":["Burch, Richard Gene"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2014-12-16T22:23:09Z","10000-01-01","1993"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/71997","(UMI)AAI9328982"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Estimating the power dissipated during normal operating conditions is a major concern in the design of integrated circuits. Since excessive power dissipation causes overheating and can lead to soft errors and permanent damage, attempts to achieve first-pass reliability require accurate and efficient power estimation. With today's closer customer interaction, many circuits are being designed for already existing systems or for systems that are being concurrently designed. Accurate and efficient power estimation methods are needed to allow such close interaction.","In this thesis, we investigate a novel approach that combines the accuracy of simulation-based approaches with the weak pattern dependence of probabilistic approaches. The resulting approach is statistical in nature; it consists of applying randomly generated input patterns to the circuit and monitoring, with a simulator, the resulting power value. This is continued until a value of power is obtained with a desired accuracy, at a specified confidence level. Since this method uses a finite number of patterns to estimate the power and the power really depends on the infinite set of possible input patterns, this method belongs to the general class of so-called Monte Carlo methods. We describe the approach and its implementation, and we show that it is accurate and efficient for VLSI circuits.","Made available in DSpace on 2014-12-16T22:23:09Z (GMT). No. of bitstreams: 1 9328982.pdf: 2597177 bytes, checksum: 57486620473cd3a47d91a16f32e89331 (MD5) Previous issue date: 1993","Embargo set by: Seth Robbins for item 72163 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","71 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1993."]},{"key":"dc:title","label":"Title","values":["Monte Carlo Methods for Reliability Analysis and Power Estimation"]}]}],"canonical_facts":{"dc:contributor":["Trick, Timothy N."],"dc:creator":["Burch, Richard Gene"],"dc:date":["2014-12-16T22:23:09Z","10000-01-01","1993"],"dc:description":["Estimating the power dissipated during normal operating conditions is a major concern in the design of integrated circuits. Since excessive power dissipation causes overheating and can lead to soft errors and permanent damage, attempts to achieve first-pass reliability require accurate and efficient power estimation. With today's closer customer interaction, many circuits are being designed for already existing systems or for systems that are being concurrently designed. Accurate and efficient power estimation methods are needed to allow such close interaction.","In this thesis, we investigate a novel approach that combines the accuracy of simulation-based approaches with the weak pattern dependence of probabilistic approaches. The resulting approach is statistical in nature; it consists of applying randomly generated input patterns to the circuit and monitoring, with a simulator, the resulting power value. This is continued until a value of power is obtained with a desired accuracy, at a specified confidence level. Since this method uses a finite number of patterns to estimate the power and the power really depends on the infinite set of possible input patterns, this method belongs to the general class of so-called Monte Carlo methods. We describe the approach and its implementation, and we show that it is accurate and efficient for VLSI circuits.","Made available in DSpace on 2014-12-16T22:23:09Z (GMT). No. of bitstreams: 1 9328982.pdf: 2597177 bytes, checksum: 57486620473cd3a47d91a16f32e89331 (MD5) Previous issue date: 1993","Embargo set by: Seth Robbins for item 72163 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","71 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1993."],"dc:identifier":["http://hdl.handle.net/2142/71997","(UMI)AAI9328982"],"dc:subject":["Engineering, Electronics and Electrical"],"dc:title":["Monte Carlo Methods for Reliability Analysis and Power Estimation"],"dc:type":["text"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:06Z"}