{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/69545"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/69545","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Testing and Error Detection in Iterative Logic Arrays","abstract":"The test methods of general iterative logic arrays (ILAs) composed of combinational cells are considered in the first part of this report. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) we assume only one cell can be faulty; and in the multiple cell fault-model (MCFM) we assume any number of cells can be faulty. Previous papers have solved the testing problems of C-testable and linear testable unilateral one-dimensional (1-D) ILAs under SCFM. The necessary and sufficient condition of a test set in unilateral 1-D ILAs under MCFM is derived here. With this condition, two procedures that can generate near-minimum test sets for linear testable and C-testable unilateral 1-D ILAs respectively are proposed. Furthermore, the results are extended to generate test sets for bilateral 1-D ILAs, unilateral tree-structured ILAs and unilateral two-dimensional ILAs under SCFM and MCFM. Finally, improving all the testing methods to cover sequential faults are proposed.","abstract_html":"The test methods of general iterative logic arrays (ILAs) composed of combinational cells are considered in the first part of this report. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) we assume only one cell can be faulty; and in the multiple cell fault-model (MCFM) we assume any number of cells can be faulty. Previous papers have solved the testing problems of C-testable and linear testable unilateral one-dimensional (1-D) ILAs under SCFM. The necessary and sufficient condition of a test set in unilateral 1-D ILAs under MCFM is derived here. With this condition, two procedures that can generate near-minimum test sets for linear testable and C-testable unilateral 1-D ILAs respectively are proposed. Furthermore, the results are extended to generate test sets for bilateral 1-D ILAs, unilateral tree-structured ILAs and unilateral two-dimensional ILAs under SCFM and MCFM. Finally, improving all the testing methods to cover sequential faults are proposed.","abstract_has_math":false,"creators":["Cheng, Wu-Tung"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Computer Science","degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1985,"date_issued":"1985","date_published":"1985","updated_at":"2026-07-22T22:26:01Z","subjects":["Computer Science"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(UMI)AAI8600148"],"render_values":[{"text":"(UMI)AAI8600148","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/69545","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Cheng, Wu-Tung"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["1985","2014-12-15T19:25:40Z","10000-01-01"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Computer Science"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Computer Science"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/69545","(UMI)AAI8600148"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The test methods of general iterative logic arrays (ILAs) composed of combinational cells are considered in the first part of this report. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) we assume only one cell can be faulty; and in the multiple cell fault-model (MCFM) we assume any number of cells can be faulty. Previous papers have solved the testing problems of C-testable and linear testable unilateral one-dimensional (1-D) ILAs under SCFM. The necessary and sufficient condition of a test set in unilateral 1-D ILAs under MCFM is derived here. With this condition, two procedures that can generate near-minimum test sets for linear testable and C-testable unilateral 1-D ILAs respectively are proposed. Furthermore, the results are extended to generate test sets for bilateral 1-D ILAs, unilateral tree-structured ILAs and unilateral two-dimensional ILAs under SCFM and MCFM. Finally, improving all the testing methods to cover sequential faults are proposed.","In the second part of this paper, using the methods of Recomputing with Shifted Operands (RESO) to detect errors in ILAs are discussed. Here, our fault model covers all kinds of faults within a cell, including permanent, nonpermanent, combinational, sequential, static, dynamic and indeterminate-logic faults. Necessary and sufficient conditions on the basic cell flow table are derived to determine if a unilateral 1-D ILA is RESO-detectable. The problems of fault location are also considered. It is shown that an arbitrary cell flow table can be augmented by the addition of some outputs to make it RESO-detectable. The implementation of RESO with rotation instead of shift operation is also considered. The results are extended to bilateral 1-D ILAs and two-dimensional ILAs.","Made available in DSpace on 2014-12-15T19:25:40Z (GMT). No. of bitstreams: 1 8600148.pdf: 4009473 bytes, checksum: 5d7722fbd217d5b1b156aafa09bd371a (MD5) Previous issue date: 1985","Embargo set by: Seth Robbins for item 69711 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","113 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985."]},{"key":"dc:title","label":"Title","values":["Testing and Error Detection in Iterative Logic Arrays"]}]}],"canonical_facts":{"dc:creator":["Cheng, Wu-Tung"],"dc:date":["1985","2014-12-15T19:25:40Z","10000-01-01"],"dc:description":["The test methods of general iterative logic arrays (ILAs) composed of combinational cells are considered in the first part of this report. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) we assume only one cell can be faulty; and in the multiple cell fault-model (MCFM) we assume any number of cells can be faulty. Previous papers have solved the testing problems of C-testable and linear testable unilateral one-dimensional (1-D) ILAs under SCFM. The necessary and sufficient condition of a test set in unilateral 1-D ILAs under MCFM is derived here. With this condition, two procedures that can generate near-minimum test sets for linear testable and C-testable unilateral 1-D ILAs respectively are proposed. Furthermore, the results are extended to generate test sets for bilateral 1-D ILAs, unilateral tree-structured ILAs and unilateral two-dimensional ILAs under SCFM and MCFM. Finally, improving all the testing methods to cover sequential faults are proposed.","In the second part of this paper, using the methods of Recomputing with Shifted Operands (RESO) to detect errors in ILAs are discussed. Here, our fault model covers all kinds of faults within a cell, including permanent, nonpermanent, combinational, sequential, static, dynamic and indeterminate-logic faults. Necessary and sufficient conditions on the basic cell flow table are derived to determine if a unilateral 1-D ILA is RESO-detectable. The problems of fault location are also considered. It is shown that an arbitrary cell flow table can be augmented by the addition of some outputs to make it RESO-detectable. The implementation of RESO with rotation instead of shift operation is also considered. The results are extended to bilateral 1-D ILAs and two-dimensional ILAs.","Made available in DSpace on 2014-12-15T19:25:40Z (GMT). No. of bitstreams: 1 8600148.pdf: 4009473 bytes, checksum: 5d7722fbd217d5b1b156aafa09bd371a (MD5) Previous issue date: 1985","Embargo set by: Seth Robbins for item 69711 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only","113 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985."],"dc:identifier":["http://hdl.handle.net/2142/69545","(UMI)AAI8600148"],"dc:subject":["Computer Science"],"dc:title":["Testing and Error Detection in Iterative Logic Arrays"],"dc:type":["text"],"thesis:degree_discipline":["Computer Science"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:26:01Z"}