{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/69396"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/69396","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Metalorganic Chemical Vapor Deposition and Its Application to the Growth of the Heterostructure Hot Electron Diode","abstract":"Metalorganic chemical vapor deposition (MOCVD) is an epitaxial crystal growth technique capable of producing high-quality compound semiconductors in thick or thin layers with abrupt junctions, excellent area uniformity, and precisely controlled thickness, doping and composition. In this work the desired characteristics of an MOCVD system are described, and design criteria necessary for their implementation are identified. Special emphasis is placed on defensive design strategies intended to limit the extent of system perturbation due to various component failure modes and normal maintenance procedures. The design of reactor computer control software is also considered, and algorithms for the growth of layers graded in both doping and composition are presented.","abstract_html":"Metalorganic chemical vapor deposition (MOCVD) is an epitaxial crystal growth technique capable of producing high-quality compound semiconductors in thick or thin layers with abrupt junctions, excellent area uniformity, and precisely controlled thickness, doping and composition. In this work the desired characteristics of an MOCVD system are described, and design criteria necessary for their implementation are identified. Special emphasis is placed on defensive design strategies intended to limit the extent of system perturbation due to various component failure modes and normal maintenance procedures. The design of reactor computer control software is also considered, and algorithms for the growth of layers graded in both doping and composition are presented.","abstract_has_math":false,"creators":["Emanuel, Mark Andrew"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":["Coleman, James,"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2014,"date_issued":"2014-12-15T19:05:33Z","date_published":"2014-12-15T19:05:33Z","updated_at":"2026-07-22T22:26:00Z","subjects":["Engineering, Electronics and Electrical"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(UMI)AAI8823122"],"render_values":[{"text":"(UMI)AAI8823122","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/69396","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Coleman, James,"]},{"key":"dc:creator","label":"Author","values":["Emanuel, Mark Andrew"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2014-12-15T19:05:33Z","10000-01-01","1988"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/69396","(UMI)AAI8823122"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Metalorganic chemical vapor deposition (MOCVD) is an epitaxial crystal growth technique capable of producing high-quality compound semiconductors in thick or thin layers with abrupt junctions, excellent area uniformity, and precisely controlled thickness, doping and composition. In this work the desired characteristics of an MOCVD system are described, and design criteria necessary for their implementation are identified. Special emphasis is placed on defensive design strategies intended to limit the extent of system perturbation due to various component failure modes and normal maintenance procedures. The design of reactor computer control software is also considered, and algorithms for the growth of layers graded in both doping and composition are presented.","Theory and experimental data are presented for the heterostructure hot electron diode (H$\\sp2$ED), a new two-terminal electronic device that exhibits 2-shaped negative differential resistance (NDR) in the dc IV characteristic. The proposed switching mechanism in this device is an abrupt transition in conduction mode from high resistance tunneling to lower resistance thermionic emission over a heterobarrier. Design criteria and MOCVD crystal growth considerations are presented for implementation of the H$\\sp2$ED in the gallium arsenide-aluminum gallium arsenide material system. It is found that the device is extremely sensitive to the background carrier concentration in the aluminum gallium arsenide barrier, with an extremely resistive barrier layer necessary for devices to exhibit NDR. Data are presented showing that the H$\\sp2$ED is capable of free oscillation at frequencies of at least 5 GHz, and of amplification to at least 17 GHz.","Made available in DSpace on 2014-12-15T19:05:33Z (GMT). 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In this work the desired characteristics of an MOCVD system are described, and design criteria necessary for their implementation are identified. Special emphasis is placed on defensive design strategies intended to limit the extent of system perturbation due to various component failure modes and normal maintenance procedures. The design of reactor computer control software is also considered, and algorithms for the growth of layers graded in both doping and composition are presented.","Theory and experimental data are presented for the heterostructure hot electron diode (H$\\sp2$ED), a new two-terminal electronic device that exhibits 2-shaped negative differential resistance (NDR) in the dc IV characteristic. The proposed switching mechanism in this device is an abrupt transition in conduction mode from high resistance tunneling to lower resistance thermionic emission over a heterobarrier. Design criteria and MOCVD crystal growth considerations are presented for implementation of the H$\\sp2$ED in the gallium arsenide-aluminum gallium arsenide material system. It is found that the device is extremely sensitive to the background carrier concentration in the aluminum gallium arsenide barrier, with an extremely resistive barrier layer necessary for devices to exhibit NDR. Data are presented showing that the H$\\sp2$ED is capable of free oscillation at frequencies of at least 5 GHz, and of amplification to at least 17 GHz.","Made available in DSpace on 2014-12-15T19:05:33Z (GMT). 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