{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/69342"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/69342","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"An Investigation of Gallium-Arsenide Materials and Devices Grown on Silicon Substrates (Molecular Beam Epitaxy, Heteroepitaxy)","abstract":"486 p.","abstract_html":"486 p.","abstract_has_math":false,"creators":["Fischer, Russell Jon"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2014,"date_issued":"2014-12-15T19:05:11Z","date_published":"2014-12-15T19:05:11Z","updated_at":"2026-07-22T22:26:00Z","subjects":["Engineering, Electronics and Electrical"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["(UMI)AAI8701486"],"render_values":[{"text":"(UMI)AAI8701486","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/69342","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Fischer, Russell Jon"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2014-12-15T19:05:11Z","10000-01-01","1986"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/69342","(UMI)AAI8701486"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["486 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.","This thesis describes the growth and characterization of GaAs based electronic devices on Si substrates. The use of Si as a substrate for growth of GaAs and related III-V compounds has many attractive features, including low cost, high mechanical strength, and higher thermal conductivity. This technology would also enable high speed GaAs based devices to be monolithically integrated with Si, thus creating many new possibilities. In this work the possibility of growing device quality GaAs on Si is demonstrated through fabrication of devices on this material. It is not only in majority carrier devices that excellent performance has been obtained but also in minority carrier devices which are much more sensitive to defects. In heterojunction bipolar transistors on Si, current gain cutoff frequencies which are comparable to the best reported values on GaAs substrates were obtained. Room temperature pulsed laser operation is also demonstrated for GaAs on Si.","Aside from the device properties, the materials properties have also been investigated. Misfit dislocation densities in the 10('4)cm('-2) range at the top of 2 (mu)m thick layers have been measured by transmission electron microscopy (TEM). Suppression of antiphase domains by recently developed growth techniques is also demonstrated by X-ray measurements, anisotropic chemical etching, and TEM.","Made available in DSpace on 2014-12-15T19:05:11Z (GMT). No. of bitstreams: 1 8701486.pdf: 4852022 bytes, checksum: 4d396c3c1b1e05705a17ece315171729 (MD5) Previous issue date: 1986","Embargo set by: Seth Robbins for item 69508 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs","U of I Only"]},{"key":"dc:title","label":"Title","values":["An Investigation of Gallium-Arsenide Materials and Devices Grown on Silicon Substrates (Molecular Beam Epitaxy, Heteroepitaxy)"]}]}],"canonical_facts":{"dc:creator":["Fischer, Russell Jon"],"dc:date":["2014-12-15T19:05:11Z","10000-01-01","1986"],"dc:description":["486 p.","Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.","This thesis describes the growth and characterization of GaAs based electronic devices on Si substrates. The use of Si as a substrate for growth of GaAs and related III-V compounds has many attractive features, including low cost, high mechanical strength, and higher thermal conductivity. This technology would also enable high speed GaAs based devices to be monolithically integrated with Si, thus creating many new possibilities. In this work the possibility of growing device quality GaAs on Si is demonstrated through fabrication of devices on this material. It is not only in majority carrier devices that excellent performance has been obtained but also in minority carrier devices which are much more sensitive to defects. In heterojunction bipolar transistors on Si, current gain cutoff frequencies which are comparable to the best reported values on GaAs substrates were obtained. Room temperature pulsed laser operation is also demonstrated for GaAs on Si.","Aside from the device properties, the materials properties have also been investigated. Misfit dislocation densities in the 10('4)cm('-2) range at the top of 2 (mu)m thick layers have been measured by transmission electron microscopy (TEM). Suppression of antiphase domains by recently developed growth techniques is also demonstrated by X-ray measurements, anisotropic chemical etching, and TEM.","Made available in DSpace on 2014-12-15T19:05:11Z (GMT). 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