{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/49624"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/49624","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"A compact model for silicon controlled rectifiers in low voltage CMOS processes","abstract":"This thesis presents an SCR compact model for simulating ESD protection circuits. The aspects of the compact model that are necessary to reproduce measurement data, such as quasi-static I-V curves and transient voltage overshoot, are discussed. These aspects include conductivity modulation of the well resistances in the SCR, impact ionization at the N-well/P-well junction, and the influence of electric fields in the well region on carrier diffusion between the anode and cathode. Further, a detailed validation of the compact model is presented. A methodology for parameter extraction is also discussed.","abstract_html":"This thesis presents an SCR compact model for simulating ESD protection circuits. The aspects of the compact model that are necessary to reproduce measurement data, such as quasi-static I-V curves and transient voltage overshoot, are discussed. These aspects include conductivity modulation of the well resistances in the SCR, impact ionization at the N-well/P-well junction, and the influence of electric fields in the well region on carrier diffusion between the anode and cathode. Further, a detailed validation of the compact model is presented. A methodology for parameter extraction is also discussed.","abstract_has_math":false,"creators":["Mertens, Robert"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engr","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2014,"date_issued":"2014-05-30T16:52:57Z","date_published":"2014-05-30T16:52:57Z","updated_at":"2026-07-22T22:25:38Z","subjects":["Complementary metal–oxide–semiconductor (CMOS)","integrated circuits","silicon","silicon controlled rectifiers (SCR)","Electrostatic discharge (ESD)"],"languages":["en"],"rights":["Copyright 2014 Robert Mertens"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/49624","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Mertens, Robert"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2014-05-30T16:52:57Z","2014-05"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Complementary metal–oxide–semiconductor (CMOS)","integrated circuits","silicon","silicon controlled rectifiers (SCR)","Electrostatic discharge (ESD)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2014 Robert Mertens"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/49624"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["This thesis presents an SCR compact model for simulating ESD protection circuits. 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