{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/46646"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/46646","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Cold-cavity measurement of excess optical loss in oxide-confined vertical cavity surface emitting lasers","abstract":"Microcavity laser design and performance optimization requires a quantitative knowledge of the cavity optical losses. A generalized method using sub-threshold spectral measurements matched to model calculations is demonstrated to determine optical loss in microcavity lasers. Cold-cavity spectral characteristics are used to extract the size dependent optical loss for small diameter oxide-confined vertical cavity surface emitting lasers. For oxide aperture diameters less than 4 !m, the oxide scattering loss can be greater than 10 cm-1, similar to the typical values of free carrier absorption loss.","abstract_html":"Microcavity laser design and performance optimization requires a quantitative knowledge of the cavity optical losses. A generalized method using sub-threshold spectral measurements matched to model calculations is demonstrated to determine optical loss in microcavity lasers. Cold-cavity spectral characteristics are used to extract the size dependent optical loss for small diameter oxide-confined vertical cavity surface emitting lasers. For oxide aperture diameters less than 4 !m, the oxide scattering loss can be greater than 10 cm-1, similar to the typical values of free carrier absorption loss.","abstract_has_math":false,"creators":["Fryslie, Stewart"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engr","degree_department":null,"school":null,"contributors":["Choquette, Kent D."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2014,"date_issued":"2014-01-16T17:57:22Z","date_published":"2014-01-16T17:57:22Z","updated_at":"2026-07-22T22:25:36Z","subjects":["vertical cavity surface emitting laser","semiconductor laser","optical loss","microcavity laser","laser"],"languages":["en"],"rights":["Copyright 2013 Stewart Fryslie"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/46646","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Choquette, Kent D."]},{"key":"dc:creator","label":"Author","values":["Fryslie, Stewart"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2014-01-16T17:57:22Z","2013-12"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["vertical cavity surface emitting laser","semiconductor laser","optical loss","microcavity laser","laser"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2013 Stewart Fryslie"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/46646"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Microcavity laser design and performance optimization requires a quantitative knowledge of the cavity optical losses. 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