{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/42211"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/42211","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Determination of the CTE tensor of materials from high temperature X-ray diffraction","abstract":"Thermal expansion is historically reported as an average coefficient to estimate the change in dimensions of a material as it is heated or cooled. This average works well for approximating thermal expansion in high-symmetry crystals, but for low-symmetry crystals (monoclinic, triclinic), anisotropy in a system shows a deviation from averages. The Coefficient of Thermal Expansion Analysis Suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second rank thermal expansion tensor using hkl values, corresponding d-hkl listings, and lattice constants obtained from powder XRD patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the thermal properties of materials with temperature when correlated with the crystal structure.","abstract_html":"Thermal expansion is historically reported as an average coefficient to estimate the change in dimensions of a material as it is heated or cooled. This average works well for approximating thermal expansion in high-symmetry crystals, but for low-symmetry crystals (monoclinic, triclinic), anisotropy in a system shows a deviation from averages. The Coefficient of Thermal Expansion Analysis Suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second rank thermal expansion tensor using hkl values, corresponding d-hkl listings, and lattice constants obtained from powder XRD patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the thermal properties of materials with temperature when correlated with the crystal structure.","abstract_has_math":false,"creators":["Jones, Zachary"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Materials Science & Engr","degree_department":null,"school":null,"contributors":["Kriven, Waltraud M."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2013,"date_issued":"2013-02-03T19:28:01Z","date_published":"2013-02-03T19:28:01Z","updated_at":"2026-07-22T22:25:33Z","subjects":["Thermal Expansion","X-ray Diffraction"],"languages":["en"],"rights":["Copyright 2012 Zachary A. Jones"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/42211","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Kriven, Waltraud M."]},{"key":"dc:creator","label":"Author","values":["Jones, Zachary"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2013-02-03T19:28:01Z","2012-12"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science & Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Thermal Expansion","X-ray Diffraction"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2012 Zachary A. Jones"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/42211"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thermal expansion is historically reported as an average coefficient to estimate the change in dimensions of a material as it is heated or cooled. This average works well for approximating thermal expansion in high-symmetry crystals, but for low-symmetry crystals (monoclinic, triclinic), anisotropy in a system shows a deviation from averages. The Coefficient of Thermal Expansion Analysis Suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second rank thermal expansion tensor using hkl values, corresponding d-hkl listings, and lattice constants obtained from powder XRD patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the thermal properties of materials with temperature when correlated with the crystal structure.","Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-12-12T16:23:03Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Jones_Zachary.pdf: 3069141 bytes, checksum: ca1fc8c56de7f900057e7e3b8c8531de (MD5)","Made available in DSpace on 2013-02-03T19:28:01Z (GMT). No. of bitstreams: 2 Zachary_Jones.pdf: 3069140 bytes, checksum: 0ad202af8f7b716b0dcf1fdf9cc05bb4 (MD5) license.txt: 4062 bytes, checksum: 02d49822c281c82e2a46bdeb0b631203 (MD5)"]},{"key":"dc:title","label":"Title","values":["Determination of the CTE tensor of materials from high temperature X-ray diffraction"]}]}],"canonical_facts":{"dc:contributor":["Kriven, Waltraud M."],"dc:creator":["Jones, Zachary"],"dc:date":["2013-02-03T19:28:01Z","2012-12"],"dc:description":["Thermal expansion is historically reported as an average coefficient to estimate the change in dimensions of a material as it is heated or cooled. This average works well for approximating thermal expansion in high-symmetry crystals, but for low-symmetry crystals (monoclinic, triclinic), anisotropy in a system shows a deviation from averages. The Coefficient of Thermal Expansion Analysis Suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second rank thermal expansion tensor using hkl values, corresponding d-hkl listings, and lattice constants obtained from powder XRD patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the thermal properties of materials with temperature when correlated with the crystal structure.","Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-12-12T16:23:03Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Jones_Zachary.pdf: 3069141 bytes, checksum: ca1fc8c56de7f900057e7e3b8c8531de (MD5)","Made available in DSpace on 2013-02-03T19:28:01Z (GMT). No. of bitstreams: 2 Zachary_Jones.pdf: 3069140 bytes, checksum: 0ad202af8f7b716b0dcf1fdf9cc05bb4 (MD5) license.txt: 4062 bytes, checksum: 02d49822c281c82e2a46bdeb0b631203 (MD5)"],"dc:identifier":["http://hdl.handle.net/2142/42211"],"dc:language":["en"],"dc:rights":["Copyright 2012 Zachary A. Jones"],"dc:subject":["Thermal Expansion","X-ray Diffraction"],"dc:title":["Determination of the CTE tensor of materials from high temperature X-ray diffraction"],"dc:type":["text"],"thesis:degree_discipline":["Materials Science & Engr"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["M.S."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:33Z"}