{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/30941"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/30941","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Effect of noise on the pull-in dynamics of an electrostatic microswitch","abstract":"The goal of this research is to investigate the effects of noise on the pull-in dynamics of a micro-electromechanical switch. We take into account thermal noise and noise present in the voltage source. Thermal noise is modeled as white noise. First, we study its effect on the linear response of the system. Then, we study the uncertainty in pull-in time caused by thermal noise. We show that thermal noise does not have a significant effect on the pull-in dynamics. For noise in voltage we study the models of Johnson and flicker noise. We see that, as these noise sources are coupled with non-linear electrostatic force, they enhance the stability of the system and thus delay the occurrence of pull-in. We further see that this noise enhanced stability is aided by the damping forces.","abstract_html":"The goal of this research is to investigate the effects of noise on the pull-in dynamics of a micro-electromechanical switch. We take into account thermal noise and noise present in the voltage source. Thermal noise is modeled as white noise. First, we study its effect on the linear response of the system. Then, we study the uncertainty in pull-in time caused by thermal noise. We show that thermal noise does not have a significant effect on the pull-in dynamics. For noise in voltage we study the models of Johnson and flicker noise. We see that, as these noise sources are coupled with non-linear electrostatic force, they enhance the stability of the system and thus delay the occurrence of pull-in. We further see that this noise enhanced stability is aided by the damping forces.","abstract_has_math":false,"creators":["Goel, Shelley"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Mechanical Engineering","degree_department":null,"school":null,"contributors":["Aluru, Narayana R."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2012,"date_issued":"2012-05-22T00:17:20Z","date_published":"2012-05-22T00:17:20Z","updated_at":"2026-07-22T22:25:29Z","subjects":["Thermal Noise","Voltage Noise","Microswitch","Micro-Electro Mechanical System (MEMS)"],"languages":["en"],"rights":["Copyright 2012 Shelley Goel"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/30941","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Aluru, Narayana R."]},{"key":"dc:creator","label":"Author","values":["Goel, Shelley"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2012-05-22T00:17:20Z","2012-05"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Mechanical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Thermal Noise","Voltage Noise","Microswitch","Micro-Electro Mechanical System (MEMS)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2012 Shelley Goel"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/30941"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["The goal of this research is to investigate the effects of noise on the pull-in dynamics of a micro-electromechanical switch. We take into account thermal noise and noise present in the voltage source. Thermal noise is modeled as white noise. First, we study its effect on the linear response of the system. Then, we study the uncertainty in pull-in time caused by thermal noise. We show that thermal noise does not have a significant effect on the pull-in dynamics. For noise in voltage we study the models of Johnson and flicker noise. We see that, as these noise sources are coupled with non-linear electrostatic force, they enhance the stability of the system and thus delay the occurrence of pull-in. We further see that this noise enhanced stability is aided by the damping forces.","Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-04-27T12:58:22Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Goel_Shelley.pdf: 592851 bytes, checksum: b26f400e5169a1aa366db7ca3acc132e (MD5)","Made available in DSpace on 2012-05-22T00:17:20Z (GMT). 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We see that, as these noise sources are coupled with non-linear electrostatic force, they enhance the stability of the system and thus delay the occurrence of pull-in. We further see that this noise enhanced stability is aided by the damping forces.","Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-04-27T12:58:22Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Goel_Shelley.pdf: 592851 bytes, checksum: b26f400e5169a1aa366db7ca3acc132e (MD5)","Made available in DSpace on 2012-05-22T00:17:20Z (GMT). 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