{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/25806"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/25806","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"The effect of point defects in copper on the anomalous transmission of X-rays","abstract":"Anomalous X-ray transmission (Borrmann) measurements were made at 4.2 K on nearly perfect copper single crystals before and after irradiation at 20 K with 3 MeV electrons (total integrated flux 0.B7 X 101B electrons/em2). The intensity in the diffracted direction was measured for the (111), (222), (333), and (220) reflecting planes. The measured intensity changes were 1.15 t ,4%, 4.52 ± .6%, 8.90 ± .8%, and 4.06 + .8% respectively. A comparison of the observed intensity changes with theoretical predictions, assuming that the damage consists of isolated interstitials and vacancies, and using previously calculated displacements associated with these defects, indicates that the interstitial is not in the split (100) configuration. Possible configurations are the body centered interstitial or the split (111) interstitial. Measurements after annealing at BOoK and 3000K were made. The measurements indicated that defect clusters were formed when the irradiated crystal was heated to 80oK, and some clusters remained after annealing at room temperature.","abstract_html":"Anomalous X-ray transmission (Borrmann) measurements were made at 4.2 K on nearly perfect copper single crystals before and after irradiation at 20 K with 3 MeV electrons (total integrated flux 0.B7 X 101B electrons/em2). The intensity in the diffracted direction was measured for the (111), (222), (333), and (220) reflecting planes. The measured intensity changes were 1.15 t ,4%, 4.52 ± .6%, 8.90 ± .8%, and 4.06 + .8% respectively. A comparison of the observed intensity changes with theoretical predictions, assuming that the damage consists of isolated interstitials and vacancies, and using previously calculated displacements associated with these defects, indicates that the interstitial is not in the split (100) configuration. Possible configurations are the body centered interstitial or the split (111) interstitial. Measurements after annealing at BOoK and 3000K were made. The measurements indicated that defect clusters were formed when the irradiated crystal was heated to 80oK, and some clusters remained after annealing at room temperature.","abstract_has_math":false,"creators":["Edelheit, Lewis Selig"],"institution":null,"degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Physics","degree_department":null,"school":null,"contributors":["Koehler, James S."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-07-14T14:27:46Z","date_published":"2011-07-14T14:27:46Z","updated_at":"2026-07-22T22:25:26Z","subjects":["point defects","copper","anomalous x-ray transmission","Borrmann measurements"],"languages":["en"],"rights":["1970 Lewis Selig Edelheit"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["6065082"],"render_values":[{"text":"6065082","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/25806","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Koehler, James S."]},{"key":"dc:creator","label":"Author","values":["Edelheit, Lewis Selig"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-07-14T14:27:46Z","10000-01-01","1970"]},{"key":"dc:type","label":"Dc Type","values":["Dissertation / Thesis","text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Physics"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["point defects","copper","anomalous x-ray transmission","Borrmann measurements"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["1970 Lewis Selig Edelheit"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["6065082","http://hdl.handle.net/2142/25806"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Anomalous X-ray transmission (Borrmann) measurements were made at 4.2 K on nearly perfect copper single crystals before and after irradiation at 20 K with 3 MeV electrons (total integrated flux 0.B7 X 101B electrons/em2). The intensity in the diffracted direction was measured for the (111), (222), (333), and (220) reflecting planes. The measured intensity changes were 1.15 t ,4%, 4.52 ± .6%, 8.90 ± .8%, and 4.06 + .8% respectively. A comparison of the observed intensity changes with theoretical predictions, assuming that the damage consists of isolated interstitials and vacancies, and using previously calculated displacements associated with these defects, indicates that the interstitial is not in the split (100) configuration. Possible configurations are the body centered interstitial or the split (111) interstitial. Measurements after annealing at BOoK and 3000K were made. The measurements indicated that defect clusters were formed when the irradiated crystal was heated to 80oK, and some clusters remained after annealing at room temperature.","Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-07-14T14:27:46Z No. of bitstreams: 1 1970_edelheit.pdf: 2102984 bytes, checksum: 440b13beb328873eff869fc5f1b3fe80 (MD5)","Made available in DSpace on 2011-07-14T14:27:46Z (GMT). No. of bitstreams: 1 1970_edelheit.pdf: 2102984 bytes, checksum: 440b13beb328873eff869fc5f1b3fe80 (MD5) Previous issue date: 1970","Restriction data tranferred 2014-07-01T11:33:07-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: Thesis","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-07-14T14:27:46Z Item is restricted indefinitely.","Thesis","U of I Only"]},{"key":"dc:title","label":"Title","values":["The effect of point defects in copper on the anomalous transmission of X-rays"]}]}],"canonical_facts":{"dc:contributor":["Koehler, James S."],"dc:creator":["Edelheit, Lewis Selig"],"dc:date":["2011-07-14T14:27:46Z","10000-01-01","1970"],"dc:description":["Anomalous X-ray transmission (Borrmann) measurements were made at 4.2 K on nearly perfect copper single crystals before and after irradiation at 20 K with 3 MeV electrons (total integrated flux 0.B7 X 101B electrons/em2). The intensity in the diffracted direction was measured for the (111), (222), (333), and (220) reflecting planes. The measured intensity changes were 1.15 t ,4%, 4.52 ± .6%, 8.90 ± .8%, and 4.06 + .8% respectively. A comparison of the observed intensity changes with theoretical predictions, assuming that the damage consists of isolated interstitials and vacancies, and using previously calculated displacements associated with these defects, indicates that the interstitial is not in the split (100) configuration. Possible configurations are the body centered interstitial or the split (111) interstitial. Measurements after annealing at BOoK and 3000K were made. The measurements indicated that defect clusters were formed when the irradiated crystal was heated to 80oK, and some clusters remained after annealing at room temperature.","Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-07-14T14:27:46Z No. of bitstreams: 1 1970_edelheit.pdf: 2102984 bytes, checksum: 440b13beb328873eff869fc5f1b3fe80 (MD5)","Made available in DSpace on 2011-07-14T14:27:46Z (GMT). No. of bitstreams: 1 1970_edelheit.pdf: 2102984 bytes, checksum: 440b13beb328873eff869fc5f1b3fe80 (MD5) Previous issue date: 1970","Restriction data tranferred 2014-07-01T11:33:07-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: Thesis","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-07-14T14:27:46Z Item is restricted indefinitely.","Thesis","U of I Only"],"dc:identifier":["6065082","http://hdl.handle.net/2142/25806"],"dc:language":["en"],"dc:rights":["1970 Lewis Selig Edelheit"],"dc:subject":["point defects","copper","anomalous x-ray transmission","Borrmann measurements"],"dc:title":["The effect of point defects in copper on the anomalous transmission of X-rays"],"dc:type":["Dissertation / Thesis","text"],"thesis:degree_discipline":["Physics"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."]},"updated_at":"2026-07-22T22:25:26Z"}