{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/22864"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/22864","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"The growth and characterization of III-V compound semiconductor materials by metalorganic chemical vapor deposition and laser photochemical vapor deposition","abstract":"Despite the vast use of metalorganic chemical vapor deposition (MOCVD) for the growth of optical and electronic devices, it is a process for which the details of the reaction mechanisms are not well understood. Efforts aimed at gaining insight into growth-related matters will be described here and involve deposition in both the low temperature, kinetically-controlled growth regime ($<$600$\\sp\\circ$C) as well as the conventional, diffusion-limited growth regime (600-800$\\sp\\circ$C). For deposition at lower temperatures, an ultraviolet excimer laser is used to assist in the growth of GaAs, motivated by the fact that the common MOCVD precursors such as trimethylgallium and arsine are absorbing in the ultraviolet region of the spectrum. Progress toward obtaining device quality material with growth at reduced substrate temperatures in the presence of laser irradiation is assessed.","abstract_html":"Despite the vast use of metalorganic chemical vapor deposition (MOCVD) for the growth of optical and electronic devices, it is a process for which the details of the reaction mechanisms are not well understood. Efforts aimed at gaining insight into growth-related matters will be described here and involve deposition in both the low temperature, kinetically-controlled growth regime ($&lt;$600$\\sp\\circ$C) as well as the conventional, diffusion-limited growth regime (600-800$\\sp\\circ$C). For deposition at lower temperatures, an ultraviolet excimer laser is used to assist in the growth of GaAs, motivated by the fact that the common MOCVD precursors such as trimethylgallium and arsine are absorbing in the ultraviolet region of the spectrum. Progress toward obtaining device quality material with growth at reduced substrate temperatures in the presence of laser irradiation is assessed.","abstract_has_math":true,"creators":["York, Pamela Kay"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical and Computer Engineering","degree_department":null,"school":null,"contributors":["Coleman, James J."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-05-07T13:54:03Z","date_published":"2011-05-07T13:54:03Z","updated_at":"2026-07-22T22:25:20Z","subjects":["Engineering, Electronics and Electrical","Physics, Condensed Matter","Engineering, Materials Science"],"languages":["eng"],"rights":["Copyright 1990 York, Pamela Kay"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9026362","(UMI)AAI9026362"],"render_values":[{"text":"AAI9026362","href":null,"code":true},{"text":"(UMI)AAI9026362","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/22864","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Coleman, James J."]},{"key":"dc:creator","label":"Author","values":["York, Pamela Kay"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-05-07T13:54:03Z","10000-01-01","1990"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical","Physics, Condensed Matter","Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 1990 York, Pamela Kay"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9026362","(UMI)AAI9026362","http://hdl.handle.net/2142/22864"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Despite the vast use of metalorganic chemical vapor deposition (MOCVD) for the growth of optical and electronic devices, it is a process for which the details of the reaction mechanisms are not well understood. Efforts aimed at gaining insight into growth-related matters will be described here and involve deposition in both the low temperature, kinetically-controlled growth regime ($<$600$\\sp\\circ$C) as well as the conventional, diffusion-limited growth regime (600-800$\\sp\\circ$C). For deposition at lower temperatures, an ultraviolet excimer laser is used to assist in the growth of GaAs, motivated by the fact that the common MOCVD precursors such as trimethylgallium and arsine are absorbing in the ultraviolet region of the spectrum. Progress toward obtaining device quality material with growth at reduced substrate temperatures in the presence of laser irradiation is assessed.","Furthermore, historically, only lattice-matched heterostructures were considered feasible options for device applications. However, the combining of the lattice-mismatched and therefore strained layers of InGaAs-GaAs-AlGaAs significantly extends the range of material parameters and increases the flexibility in the band structure engineering of electronic and optical devices. The existence of strain brings about several important modifications to the energy band structure that lead to improved performance over unstrained quantum well lasers. The unique metallurgical aspects of strained materials and, in particular, the consequences of mixing the seemingly incompatible alloys of In$\\sb{\\rm x}$Ga$\\sb{\\rm 1-x}$As and Al$\\sb{\\rm y}$Ga$\\sb{\\rm 1-y}$As on GaAs are presented and discussed here. A brief theoretical formulation of strain-induced modifications to the InGaAs band structure, the relevance of these changes to quantum well lasers, and experimental observations in various sets of experiments designed to ascertain the viability of strained InGaAs-GaAs-AlGaAs quantum well lasers are described.","Made available in DSpace on 2011-05-07T13:54:03Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9026362.pdf: 6791990 bytes, checksum: 0340c4a5b51d9add130cbb924ccf43c4 (MD5) Previous issue date: 1990","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:00:32Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:28:38-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"]},{"key":"dc:title","label":"Title","values":["The growth and characterization of III-V compound semiconductor materials by metalorganic chemical vapor deposition and laser photochemical vapor deposition"]}]}],"canonical_facts":{"dc:contributor":["Coleman, James J."],"dc:creator":["York, Pamela Kay"],"dc:date":["2011-05-07T13:54:03Z","10000-01-01","1990"],"dc:description":["Despite the vast use of metalorganic chemical vapor deposition (MOCVD) for the growth of optical and electronic devices, it is a process for which the details of the reaction mechanisms are not well understood. Efforts aimed at gaining insight into growth-related matters will be described here and involve deposition in both the low temperature, kinetically-controlled growth regime ($<$600$\\sp\\circ$C) as well as the conventional, diffusion-limited growth regime (600-800$\\sp\\circ$C). For deposition at lower temperatures, an ultraviolet excimer laser is used to assist in the growth of GaAs, motivated by the fact that the common MOCVD precursors such as trimethylgallium and arsine are absorbing in the ultraviolet region of the spectrum. Progress toward obtaining device quality material with growth at reduced substrate temperatures in the presence of laser irradiation is assessed.","Furthermore, historically, only lattice-matched heterostructures were considered feasible options for device applications. However, the combining of the lattice-mismatched and therefore strained layers of InGaAs-GaAs-AlGaAs significantly extends the range of material parameters and increases the flexibility in the band structure engineering of electronic and optical devices. The existence of strain brings about several important modifications to the energy band structure that lead to improved performance over unstrained quantum well lasers. The unique metallurgical aspects of strained materials and, in particular, the consequences of mixing the seemingly incompatible alloys of In$\\sb{\\rm x}$Ga$\\sb{\\rm 1-x}$As and Al$\\sb{\\rm y}$Ga$\\sb{\\rm 1-y}$As on GaAs are presented and discussed here. A brief theoretical formulation of strain-induced modifications to the InGaAs band structure, the relevance of these changes to quantum well lasers, and experimental observations in various sets of experiments designed to ascertain the viability of strained InGaAs-GaAs-AlGaAs quantum well lasers are described.","Made available in DSpace on 2011-05-07T13:54:03Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9026362.pdf: 6791990 bytes, checksum: 0340c4a5b51d9add130cbb924ccf43c4 (MD5) Previous issue date: 1990","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:00:32Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:28:38-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"],"dc:identifier":["AAI9026362","(UMI)AAI9026362","http://hdl.handle.net/2142/22864"],"dc:language":["eng"],"dc:rights":["Copyright 1990 York, Pamela Kay"],"dc:subject":["Engineering, Electronics and Electrical","Physics, Condensed Matter","Engineering, Materials Science"],"dc:title":["The growth and characterization of III-V compound semiconductor materials by metalorganic chemical vapor deposition and laser photochemical vapor deposition"],"dc:type":["text"],"thesis:degree_discipline":["Electrical and Computer Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:20Z"}