{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/21529"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/21529","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Thermal and photochemical vapor deposition of aluminum nitride and gallium nitride","abstract":"Currently, the optical spectrum of the III-V compound semiconductors has been largely confined, with a few notable exceptions, to the visible red-orange to infrared portion of the electromagnetic spectrum ($\\sim$650 nm to $\\sim$1550 nm). The AlGaN material system may be able to extend this range to the visible green, blue and even ultraviolet regions. The current status of work on the column III-nitride system of compound semiconductors is reviewed with special attention given to the material challenges presently limiting sophisticated device development. Furthermore, the organometallic vapor phase epitaxy (OMVPE) method of growing these materials is discussed in detail in terms of process physics and reactor design and operation.","abstract_html":"Currently, the optical spectrum of the III-V compound semiconductors has been largely confined, with a few notable exceptions, to the visible red-orange to infrared portion of the electromagnetic spectrum ($\\sim$650 nm to $\\sim$1550 nm). The AlGaN material system may be able to extend this range to the visible green, blue and even ultraviolet regions. The current status of work on the column III-nitride system of compound semiconductors is reviewed with special attention given to the material challenges presently limiting sophisticated device development. Furthermore, the organometallic vapor phase epitaxy (OMVPE) method of growing these materials is discussed in detail in terms of process physics and reactor design and operation.","abstract_has_math":true,"creators":["Alwan, James Jamil"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical and Computer Engineering","degree_department":null,"school":null,"contributors":["Eden, James G."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-05-07T13:11:17Z","date_published":"2011-05-07T13:11:17Z","updated_at":"2026-07-22T22:25:18Z","subjects":["Engineering, Electronics and Electrical","Engineering, Materials Science"],"languages":["eng"],"rights":["Copyright 1994 Alwan, James Jamil"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9512285","(UMI)AAI9512285"],"render_values":[{"text":"AAI9512285","href":null,"code":true},{"text":"(UMI)AAI9512285","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/21529","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Eden, James G."]},{"key":"dc:creator","label":"Author","values":["Alwan, James Jamil"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-05-07T13:11:17Z","10000-01-01","1994"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical","Engineering, Materials Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 1994 Alwan, James Jamil"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9512285","(UMI)AAI9512285","http://hdl.handle.net/2142/21529"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Currently, the optical spectrum of the III-V compound semiconductors has been largely confined, with a few notable exceptions, to the visible red-orange to infrared portion of the electromagnetic spectrum ($\\sim$650 nm to $\\sim$1550 nm). The AlGaN material system may be able to extend this range to the visible green, blue and even ultraviolet regions. The current status of work on the column III-nitride system of compound semiconductors is reviewed with special attention given to the material challenges presently limiting sophisticated device development. Furthermore, the organometallic vapor phase epitaxy (OMVPE) method of growing these materials is discussed in detail in terms of process physics and reactor design and operation.","Fundamental characteristics of the OMVPE growth of AlN and GaN on sapphire substrates at low temperatures and pressures are presented. The precursor adsorption and nucleation behavior was investigated. A model of dissociative adsorption is developed to explain the observed trends. The use of thin AlN buffer layers to improve nucleation and crystallinity of GaN layers is presented and discussed.","The OMVPE growth of these materials was further investigated via the introduction of UV radiation to the chamber during growth. The results of growth under such conditions are presented and discussed. A model of ammonia photolysis is developed and presented, which describes the photochemical growth effects observed and suggests a mechanism of nitrogen incorporation in thermal OMVPE growth of AlN and GaN.","Made available in DSpace on 2011-05-07T13:11:17Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9512285.pdf: 4111277 bytes, checksum: cbcb15a7b4a85dcfac5d6aa1eb6ed5ea (MD5) Previous issue date: 1994","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:51:24Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:23:35-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"]},{"key":"dc:title","label":"Title","values":["Thermal and photochemical vapor deposition of aluminum nitride and gallium nitride"]}]}],"canonical_facts":{"dc:contributor":["Eden, James G."],"dc:creator":["Alwan, James Jamil"],"dc:date":["2011-05-07T13:11:17Z","10000-01-01","1994"],"dc:description":["Currently, the optical spectrum of the III-V compound semiconductors has been largely confined, with a few notable exceptions, to the visible red-orange to infrared portion of the electromagnetic spectrum ($\\sim$650 nm to $\\sim$1550 nm). The AlGaN material system may be able to extend this range to the visible green, blue and even ultraviolet regions. The current status of work on the column III-nitride system of compound semiconductors is reviewed with special attention given to the material challenges presently limiting sophisticated device development. Furthermore, the organometallic vapor phase epitaxy (OMVPE) method of growing these materials is discussed in detail in terms of process physics and reactor design and operation.","Fundamental characteristics of the OMVPE growth of AlN and GaN on sapphire substrates at low temperatures and pressures are presented. The precursor adsorption and nucleation behavior was investigated. A model of dissociative adsorption is developed to explain the observed trends. The use of thin AlN buffer layers to improve nucleation and crystallinity of GaN layers is presented and discussed.","The OMVPE growth of these materials was further investigated via the introduction of UV radiation to the chamber during growth. The results of growth under such conditions are presented and discussed. A model of ammonia photolysis is developed and presented, which describes the photochemical growth effects observed and suggests a mechanism of nitrogen incorporation in thermal OMVPE growth of AlN and GaN.","Made available in DSpace on 2011-05-07T13:11:17Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9512285.pdf: 4111277 bytes, checksum: cbcb15a7b4a85dcfac5d6aa1eb6ed5ea (MD5) Previous issue date: 1994","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:51:24Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:23:35-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"],"dc:identifier":["AAI9512285","(UMI)AAI9512285","http://hdl.handle.net/2142/21529"],"dc:language":["eng"],"dc:rights":["Copyright 1994 Alwan, James Jamil"],"dc:subject":["Engineering, Electronics and Electrical","Engineering, Materials Science"],"dc:title":["Thermal and photochemical vapor deposition of aluminum nitride and gallium nitride"],"dc:type":["text"],"thesis:degree_discipline":["Electrical and Computer Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:18Z"}