{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/19024"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/19024","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"The development of performance measures and diagnostic procedures for X(bar) and S(2) charts","abstract":"In today's competitive marketplace, companies must continually strive for improved quality and productivity of its products and processes just to maintain its competitive position. For this reason, quality systems were developed to improve quality through the design and manipulation of process resources over time. When examining a specific portion of a process, called a QC window, statistical process control methods, such as Shewhart charts, are responsible for the observation, evaluation, and diagnosis of processes to aid in the decision and implementation of corrective action.","abstract_html":"In today's competitive marketplace, companies must continually strive for improved quality and productivity of its products and processes just to maintain its competitive position. For this reason, quality systems were developed to improve quality through the design and manipulation of process resources over time. When examining a specific portion of a process, called a QC window, statistical process control methods, such as Shewhart charts, are responsible for the observation, evaluation, and diagnosis of processes to aid in the decision and implementation of corrective action.","abstract_has_math":false,"creators":["Rahn, Gregory Ernest"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Industrial Engineering","degree_department":null,"school":null,"contributors":["Kapoor, Shiv G."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-05-07T11:54:39Z","date_published":"2011-05-07T11:54:39Z","updated_at":"2026-07-22T22:25:12Z","subjects":["Statistics","Industrial Engineering"],"languages":["eng"],"rights":["Copyright 1992 Rahn, Gregory Ernest"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9215875","(UMI)AAI9215875"],"render_values":[{"text":"AAI9215875","href":null,"code":true},{"text":"(UMI)AAI9215875","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/19024","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Kapoor, Shiv G."]},{"key":"dc:creator","label":"Author","values":["Rahn, Gregory Ernest"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-05-07T11:54:39Z","10000-01-01","1992"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Industrial Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Statistics","Industrial Engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 1992 Rahn, Gregory Ernest"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9215875","(UMI)AAI9215875","http://hdl.handle.net/2142/19024"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["In today's competitive marketplace, companies must continually strive for improved quality and productivity of its products and processes just to maintain its competitive position. For this reason, quality systems were developed to improve quality through the design and manipulation of process resources over time. When examining a specific portion of a process, called a QC window, statistical process control methods, such as Shewhart charts, are responsible for the observation, evaluation, and diagnosis of processes to aid in the decision and implementation of corrective action.","This dissertation develops methods to improve the evaluation and diagnostic elements of the QC window. To enhance the evaluation capability of Shewhart control charts, performance measures in terms of operational characteristics, are defined and developed for the X chart, S$\\sp2$ chart, and both charts combined. These performance measures are analyzed with respect to process shifts in both mean and variance. In addition, performance is enhanced by: (a) enforcing four rules on the S$\\sp2$ chart to improve sensitivity to variance shifts (b) modifying the control limits on both the X and S$\\sp2$ charts to capitalize on the distinct relationships between rules as well as quantifying the tradeoff between the probability of a false alarm ($\\alpha$) and the probability of a false indication of control ($\\beta$).","To support the diagnostic capability of Shewhart charts, a sequential diagnostic procedure is developed that estimates the mean and variance of a process given observed control chart performance. Once the current state of the process is identified, the decision and implementation of corrective action can then be performed to position the process at its desired state. By improving the evaluation and diagnostic capability of control charts, the work presented in this thesis expands the role of control charts, thus enabling them to reach their full potential.","Made available in DSpace on 2011-05-07T11:54:39Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9215875.pdf: 12019483 bytes, checksum: b9f86951bc0970b600c4c2850b2f786a (MD5) Previous issue date: 1992","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:34:08Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:12:55-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"]},{"key":"dc:title","label":"Title","values":["The development of performance measures and diagnostic procedures for X(bar) and S(2) charts"]}]}],"canonical_facts":{"dc:contributor":["Kapoor, Shiv G."],"dc:creator":["Rahn, Gregory Ernest"],"dc:date":["2011-05-07T11:54:39Z","10000-01-01","1992"],"dc:description":["In today's competitive marketplace, companies must continually strive for improved quality and productivity of its products and processes just to maintain its competitive position. For this reason, quality systems were developed to improve quality through the design and manipulation of process resources over time. When examining a specific portion of a process, called a QC window, statistical process control methods, such as Shewhart charts, are responsible for the observation, evaluation, and diagnosis of processes to aid in the decision and implementation of corrective action.","This dissertation develops methods to improve the evaluation and diagnostic elements of the QC window. To enhance the evaluation capability of Shewhart control charts, performance measures in terms of operational characteristics, are defined and developed for the X chart, S$\\sp2$ chart, and both charts combined. These performance measures are analyzed with respect to process shifts in both mean and variance. In addition, performance is enhanced by: (a) enforcing four rules on the S$\\sp2$ chart to improve sensitivity to variance shifts (b) modifying the control limits on both the X and S$\\sp2$ charts to capitalize on the distinct relationships between rules as well as quantifying the tradeoff between the probability of a false alarm ($\\alpha$) and the probability of a false indication of control ($\\beta$).","To support the diagnostic capability of Shewhart charts, a sequential diagnostic procedure is developed that estimates the mean and variance of a process given observed control chart performance. Once the current state of the process is identified, the decision and implementation of corrective action can then be performed to position the process at its desired state. By improving the evaluation and diagnostic capability of control charts, the work presented in this thesis expands the role of control charts, thus enabling them to reach their full potential.","Made available in DSpace on 2011-05-07T11:54:39Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9215875.pdf: 12019483 bytes, checksum: b9f86951bc0970b600c4c2850b2f786a (MD5) Previous issue date: 1992","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:34:08Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:12:55-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"],"dc:identifier":["AAI9215875","(UMI)AAI9215875","http://hdl.handle.net/2142/19024"],"dc:language":["eng"],"dc:rights":["Copyright 1992 Rahn, Gregory Ernest"],"dc:subject":["Statistics","Industrial Engineering"],"dc:title":["The development of performance measures and diagnostic procedures for X(bar) and S(2) charts"],"dc:type":["text"],"thesis:degree_discipline":["Industrial Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:12Z"}