{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/125532"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/125532","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Application of machine learning in real-space structural characterization of nanomaterials","abstract":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-02-04 without embargo terms","abstract_html":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-02-04 without embargo terms","abstract_has_math":false,"creators":["Yao, Lehan"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Materials Science & Engr","degree_department":null,"school":null,"contributors":["Chen, Qian","Schroeder, Charles M.","Statt, Antonia","Murphy, Catherine Jones"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2024,"date_issued":"2024-08","date_published":"2024-08","updated_at":"2026-07-22T22:25:02Z","subjects":["Electron Microscopy","Machine Learning","Nanomaterials"],"languages":["en","eng"],"rights":["Copyright 2024 Lehan Yao"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/2142/125532","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Chen, Qian","Schroeder, Charles M.","Statt, Antonia","Murphy, Catherine Jones"]},{"key":"dc:creator","label":"Author","values":["Yao, Lehan"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2024-08","2024-06-25"]},{"key":"dc:type","label":"Dc Type","values":["text","Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Materials Science & Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electron Microscopy","Machine Learning","Nanomaterials"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en","eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2024 Lehan Yao"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://hdl.handle.net/2142/125532"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-02-04 without embargo terms","The student, Lehan Yao, accepted the attached license on 2024-06-21 at 17:53.","The student, Lehan Yao, submitted this Dissertation for approval on 2024-06-21 at 18:13.","This Dissertation was approved for publication on 2024-06-25 at 09:45.","DSpace SAF Submission Ingestion Package generated from Vireo submission #20860 on 2025-02-04 at 21:03:53","The first step in real-space structural characterization of nanomaterials is essentially equivalent to the creation of a digital copy of the materials sample, where the characterization is far from finished. Unlike the traditional ensemble averaging characterization such as diffraction techniques, real-space characterization directly provides image-like data. Although the image-like data look more intuitive to human beings, they are considered “rawer” for the quantitative information extraction for scientific research. Meanwhile, the heterogeneous nature of nanomaterials such as crystal grains, defects, and polydispersity further exaggerates the difficulty in their data analysis. For a long time, real-space imaging only played the supporting roles in nanomaterials characterization. Examples include solely being displayed for demonstration or providing for the manual measurement of some local features. The recent development of real-space characterization techniques such as high-throughput imaging, time series imaging, and tomography further render the situation more serious by increasing the data volume and dimensionality. To ensure the efficiency in communications of scientific research, quantitative analysis has to be performed to transfer those large-volume real-space characterization data to digestible and concise conclusions. The recent advancements in machine learning and especially those image-based algorithms such as image classification and image segmentation undoubtedly open opportunities for real-space characterization data analysis. This dissertation intends to apply cutting-edge machine learning algorithms to tackle the challenges in real-space nanomaterials characterization. Specifically, supervised neural networks are employed to achieve the accurate nanoparticle tracking in liquid-phase transmission electron microscopy videos under high noise, and then an unsupervised neural network training workflow is developed to solve the missing-wedge artifact in electron tomography, as examples of data processing in high-dimensional real-space characterization. Next, the applications of unsupervised machine learning on data interpretation are demonstrated, where dimension-reduction and clustering algorithms visualize and summarize the typical features presenting in the large-volume characterization data. Lastly, an automation of electron tomography is achieved by the real-time data processing and the feedback control of the equipment, where the fast electron tomography at continuous time points is realized, further increasing dimensionality of the real-space nanomaterials characterization."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Application of machine learning in real-space structural characterization of nanomaterials"]}]}],"canonical_facts":{"dc:contributor":["Chen, Qian","Schroeder, Charles M.","Statt, Antonia","Murphy, Catherine Jones"],"dc:creator":["Yao, Lehan"],"dc:date":["2024-08","2024-06-25"],"dc:description":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-02-04 without embargo terms","The student, Lehan Yao, accepted the attached license on 2024-06-21 at 17:53.","The student, Lehan Yao, submitted this Dissertation for approval on 2024-06-21 at 18:13.","This Dissertation was approved for publication on 2024-06-25 at 09:45.","DSpace SAF Submission Ingestion Package generated from Vireo submission #20860 on 2025-02-04 at 21:03:53","The first step in real-space structural characterization of nanomaterials is essentially equivalent to the creation of a digital copy of the materials sample, where the characterization is far from finished. Unlike the traditional ensemble averaging characterization such as diffraction techniques, real-space characterization directly provides image-like data. Although the image-like data look more intuitive to human beings, they are considered “rawer” for the quantitative information extraction for scientific research. Meanwhile, the heterogeneous nature of nanomaterials such as crystal grains, defects, and polydispersity further exaggerates the difficulty in their data analysis. For a long time, real-space imaging only played the supporting roles in nanomaterials characterization. Examples include solely being displayed for demonstration or providing for the manual measurement of some local features. The recent development of real-space characterization techniques such as high-throughput imaging, time series imaging, and tomography further render the situation more serious by increasing the data volume and dimensionality. To ensure the efficiency in communications of scientific research, quantitative analysis has to be performed to transfer those large-volume real-space characterization data to digestible and concise conclusions. The recent advancements in machine learning and especially those image-based algorithms such as image classification and image segmentation undoubtedly open opportunities for real-space characterization data analysis. This dissertation intends to apply cutting-edge machine learning algorithms to tackle the challenges in real-space nanomaterials characterization. Specifically, supervised neural networks are employed to achieve the accurate nanoparticle tracking in liquid-phase transmission electron microscopy videos under high noise, and then an unsupervised neural network training workflow is developed to solve the missing-wedge artifact in electron tomography, as examples of data processing in high-dimensional real-space characterization. Next, the applications of unsupervised machine learning on data interpretation are demonstrated, where dimension-reduction and clustering algorithms visualize and summarize the typical features presenting in the large-volume characterization data. Lastly, an automation of electron tomography is achieved by the real-time data processing and the feedback control of the equipment, where the fast electron tomography at continuous time points is realized, further increasing dimensionality of the real-space nanomaterials characterization."],"dc:format":["application/pdf"],"dc:identifier":["https://hdl.handle.net/2142/125532"],"dc:language":["en","eng"],"dc:rights":["Copyright 2024 Lehan Yao"],"dc:subject":["Electron Microscopy","Machine Learning","Nanomaterials"],"dc:title":["Application of machine learning in real-space structural characterization of nanomaterials"],"dc:type":["text","Thesis"],"thesis:degree_discipline":["Materials Science & Engr"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:02Z"}