{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/108275"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/108275","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Nanoscale infrared absorption imaging and tomography","abstract":"Near-field spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials. While several techniques now provide nanoscale chemical maps by combining molecular vibrational spectroscopies with Atomic Force Microscopy (AFM), data are often complicated by the measurement apparatus, light matter interaction scheme and the low signal to noise ratio. Together, these effects have not permitted reliable analytical measurements in a near-field configuration. In this thesis, we study the contrast mechanism of contact mode Atomic Force Microscopy – Infrared (AFM-IR) spectroscopic imaging to enable accurate, nanoscale infrared absorption imaging. We first describe the analytical solution of a rectangular cross-section cantilever beam mechanically coupled to a vertically-perturbed surface. From this understanding, we show the AFM-IR signal (recorded using heterodyne detection) can be described as the product of the local photo-induced, sample expansion and the cantilever resonance response (responsivity). We use the insight obtained to develop a new approach for removing cantilever responsivity contrast by recording an additional signal resulting from a constant reference expansion generated by a mechanical actuator (piezo) placed under the sample. Dividing the raw AFM-IR contrast by this reference signal at each sample position eliminates spatial responsivity variations enabling accurate chemical imaging. Although the ratio approach corrects for spatial responsivity variations, time-dependent changes in responsivity produce noise which scales with cantilever deflection. Next, we demonstrate a closed-loop controller for the piezo actuator to maintain zero deflection through destructive interference of the piezo and photo-induced expansions. Measuring the piezo voltage offers an alternative AFM-IR measurement with low susceptibility to both spatial and temporal changes in responsivity improving the SNR by >5x. Last, we describe an analytical Green’s function derived from Thermoelasticity relating 3 dimensional heat generation to vertical surface expansion for a n-layer laminated, half-space. From this theory, we show the image resolution is dependent on parameters such as sample thickness and material properties and propose a new method for distinguishing absorption in 3 dimensions harnessing the frequency dependent thermal diffusion.","abstract_html":"Near-field spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials. While several techniques now provide nanoscale chemical maps by combining molecular vibrational spectroscopies with Atomic Force Microscopy (AFM), data are often complicated by the measurement apparatus, light matter interaction scheme and the low signal to noise ratio. Together, these effects have not permitted reliable analytical measurements in a near-field configuration. In this thesis, we study the contrast mechanism of contact mode Atomic Force Microscopy – Infrared (AFM-IR) spectroscopic imaging to enable accurate, nanoscale infrared absorption imaging. We first describe the analytical solution of a rectangular cross-section cantilever beam mechanically coupled to a vertically-perturbed surface. From this understanding, we show the AFM-IR signal (recorded using heterodyne detection) can be described as the product of the local photo-induced, sample expansion and the cantilever resonance response (responsivity). We use the insight obtained to develop a new approach for removing cantilever responsivity contrast by recording an additional signal resulting from a constant reference expansion generated by a mechanical actuator (piezo) placed under the sample. Dividing the raw AFM-IR contrast by this reference signal at each sample position eliminates spatial responsivity variations enabling accurate chemical imaging. Although the ratio approach corrects for spatial responsivity variations, time-dependent changes in responsivity produce noise which scales with cantilever deflection. Next, we demonstrate a closed-loop controller for the piezo actuator to maintain zero deflection through destructive interference of the piezo and photo-induced expansions. Measuring the piezo voltage offers an alternative AFM-IR measurement with low susceptibility to both spatial and temporal changes in responsivity improving the SNR by >5x. Last, we describe an analytical Green’s function derived from Thermoelasticity relating 3 dimensional heat generation to vertical surface expansion for a n-layer laminated, half-space. From this theory, we show the image resolution is dependent on parameters such as sample thickness and material properties and propose a new method for distinguishing absorption in 3 dimensions harnessing the frequency dependent thermal diffusion.","abstract_has_math":false,"creators":["Kenkel, Seth"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Mechanical Engineering","degree_department":null,"school":null,"contributors":["Bhargava, Rohit","Sinha, Sanjiv","Cahill, David","Aluru, Narayana"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2020,"date_issued":"2020-08-27T00:50:02Z","date_published":"2020-08-27T00:50:02Z","updated_at":"2026-07-22T22:24:48Z","subjects":["microscopy","spectroscopy","AFM"],"languages":["en"],"rights":["Copyright 2020 Seth Kenkel"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/108275","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Bhargava, Rohit","Sinha, Sanjiv","Cahill, David","Aluru, Narayana"]},{"key":"dc:creator","label":"Author","values":["Kenkel, Seth"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2020-08-27T00:50:02Z","2022-08-27T00:51:40Z","2020-05-07","2020-05"]},{"key":"dc:type","label":"Dc Type","values":["text","Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Mechanical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["microscopy","spectroscopy","AFM"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2020 Seth Kenkel"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/108275"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Near-field spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials. While several techniques now provide nanoscale chemical maps by combining molecular vibrational spectroscopies with Atomic Force Microscopy (AFM), data are often complicated by the measurement apparatus, light matter interaction scheme and the low signal to noise ratio. Together, these effects have not permitted reliable analytical measurements in a near-field configuration. In this thesis, we study the contrast mechanism of contact mode Atomic Force Microscopy – Infrared (AFM-IR) spectroscopic imaging to enable accurate, nanoscale infrared absorption imaging. We first describe the analytical solution of a rectangular cross-section cantilever beam mechanically coupled to a vertically-perturbed surface. From this understanding, we show the AFM-IR signal (recorded using heterodyne detection) can be described as the product of the local photo-induced, sample expansion and the cantilever resonance response (responsivity). We use the insight obtained to develop a new approach for removing cantilever responsivity contrast by recording an additional signal resulting from a constant reference expansion generated by a mechanical actuator (piezo) placed under the sample. Dividing the raw AFM-IR contrast by this reference signal at each sample position eliminates spatial responsivity variations enabling accurate chemical imaging. Although the ratio approach corrects for spatial responsivity variations, time-dependent changes in responsivity produce noise which scales with cantilever deflection. Next, we demonstrate a closed-loop controller for the piezo actuator to maintain zero deflection through destructive interference of the piezo and photo-induced expansions. Measuring the piezo voltage offers an alternative AFM-IR measurement with low susceptibility to both spatial and temporal changes in responsivity improving the SNR by >5x. Last, we describe an analytical Green’s function derived from Thermoelasticity relating 3 dimensional heat generation to vertical surface expansion for a n-layer laminated, half-space. From this theory, we show the image resolution is dependent on parameters such as sample thickness and material properties and propose a new method for distinguishing absorption in 3 dimensions harnessing the frequency dependent thermal diffusion.","Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2022-05-01","The student, Seth Kenkel, accepted the attached license on 2020-04-25 at 15:25.","The student, Seth Kenkel, submitted this Dissertation for approval on 2020-04-25 at 15:36.","This Dissertation was approved for publication on 2020-05-07 at 13:24.","DSpace SAF Submission Ingestion Package generated from Vireo submission #15073 on 2020-08-25 at 17:40:56","Made available in DSpace on 2020-08-27T00:50:02Z (GMT). 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While several techniques now provide nanoscale chemical maps by combining molecular vibrational spectroscopies with Atomic Force Microscopy (AFM), data are often complicated by the measurement apparatus, light matter interaction scheme and the low signal to noise ratio. Together, these effects have not permitted reliable analytical measurements in a near-field configuration. In this thesis, we study the contrast mechanism of contact mode Atomic Force Microscopy – Infrared (AFM-IR) spectroscopic imaging to enable accurate, nanoscale infrared absorption imaging. We first describe the analytical solution of a rectangular cross-section cantilever beam mechanically coupled to a vertically-perturbed surface. From this understanding, we show the AFM-IR signal (recorded using heterodyne detection) can be described as the product of the local photo-induced, sample expansion and the cantilever resonance response (responsivity). We use the insight obtained to develop a new approach for removing cantilever responsivity contrast by recording an additional signal resulting from a constant reference expansion generated by a mechanical actuator (piezo) placed under the sample. Dividing the raw AFM-IR contrast by this reference signal at each sample position eliminates spatial responsivity variations enabling accurate chemical imaging. Although the ratio approach corrects for spatial responsivity variations, time-dependent changes in responsivity produce noise which scales with cantilever deflection. Next, we demonstrate a closed-loop controller for the piezo actuator to maintain zero deflection through destructive interference of the piezo and photo-induced expansions. Measuring the piezo voltage offers an alternative AFM-IR measurement with low susceptibility to both spatial and temporal changes in responsivity improving the SNR by >5x. Last, we describe an analytical Green’s function derived from Thermoelasticity relating 3 dimensional heat generation to vertical surface expansion for a n-layer laminated, half-space. From this theory, we show the image resolution is dependent on parameters such as sample thickness and material properties and propose a new method for distinguishing absorption in 3 dimensions harnessing the frequency dependent thermal diffusion.","Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2022-05-01","The student, Seth Kenkel, accepted the attached license on 2020-04-25 at 15:25.","The student, Seth Kenkel, submitted this Dissertation for approval on 2020-04-25 at 15:36.","This Dissertation was approved for publication on 2020-05-07 at 13:24.","DSpace SAF Submission Ingestion Package generated from Vireo submission #15073 on 2020-08-25 at 17:40:56","Made available in DSpace on 2020-08-27T00:50:02Z (GMT). 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