{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/102484"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/102484","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Extracting frequency domain network parameters using the latency insertion method","abstract":"In this thesis, a tool is presented for extracting frequency domain scattering parameters that utilizes a time domain circuit simulation algorithm called the latency insertion method (LIM). LIM is a finite difference formulation comparable with current industry standard circuit simulators, with several advantages, namely linear numerical complexity. In this work, the theoretical underpinnings of LIM and the tool are established. The tool is comprehensively explained and validated, and its limitations are discussed. 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