{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/101631"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/101631","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Detection of ESD-induced soft errors","abstract":"IEC-61000-4-2 compliant ESD discharges are performed on a microcontroller. The effect of ESD-induced noise on a digital system having a workload is examined. UART interface present on-chip is used for memory and register readout. Hardware voltage monitors developed previously are included in the design to report the on-die supply noise. A correlation between the voltage disturbance and soft errors induced is identified. The threshold for such disturbances is found. The results are validated across multiple chips. Memory elements are found to be more immune than registers.","abstract_html":"IEC-61000-4-2 compliant ESD discharges are performed on a microcontroller. The effect of ESD-induced noise on a digital system having a workload is examined. UART interface present on-chip is used for memory and register readout. Hardware voltage monitors developed previously are included in the design to report the on-die supply noise. A correlation between the voltage disturbance and soft errors induced is identified. The threshold for such disturbances is found. The results are validated across multiple chips. Memory elements are found to be more immune than registers.","abstract_has_math":false,"creators":["Mysore Vijayaraj, Prajwal"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engr","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2018,"date_issued":"2018-09-27T16:18:05Z","date_published":"2018-09-27T16:18:05Z","updated_at":"2026-07-22T22:24:40Z","subjects":["Bit flips","ESD","microcontroller","soft errors","Rail clamp","Phase margin"],"languages":["en"],"rights":["Copyright 2018 Prajwal Mysore Vijayaraj"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/101631","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Mysore Vijayaraj, Prajwal"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2018-09-27T16:18:05Z","2018-07-20","2018-08"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Bit flips","ESD","microcontroller","soft errors","Rail clamp","Phase margin"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2018 Prajwal Mysore Vijayaraj"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/101631"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["IEC-61000-4-2 compliant ESD discharges are performed on a microcontroller. The effect of ESD-induced noise on a digital system having a workload is examined. UART interface present on-chip is used for memory and register readout. Hardware voltage monitors developed previously are included in the design to report the on-die supply noise. A correlation between the voltage disturbance and soft errors induced is identified. The threshold for such disturbances is found. The results are validated across multiple chips. Memory elements are found to be more immune than registers.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2018-09-27 without embargo terms","The student, Prajwal Mysore Vijayaraj, accepted the attached license on 2018-07-20 at 15:49.","The student, Prajwal Mysore Vijayaraj, submitted this Thesis for approval on 2018-07-20 at 16:33.","This Thesis was approved for publication on 2018-07-20 at 16:39.","DSpace SAF Submission Ingestion Package generated from Vireo submission #12954 on 2018-09-27 at 10:50:26","Made available in DSpace on 2018-09-27T16:18:05Z (GMT). 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The threshold for such disturbances is found. The results are validated across multiple chips. Memory elements are found to be more immune than registers.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2018-09-27 without embargo terms","The student, Prajwal Mysore Vijayaraj, accepted the attached license on 2018-07-20 at 15:49.","The student, Prajwal Mysore Vijayaraj, submitted this Thesis for approval on 2018-07-20 at 16:33.","This Thesis was approved for publication on 2018-07-20 at 16:39.","DSpace SAF Submission Ingestion Package generated from Vireo submission #12954 on 2018-09-27 at 10:50:26","Made available in DSpace on 2018-09-27T16:18:05Z (GMT). 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