On fault coverage and fault simulation for multiple signature analysis BIST schemes

Fault coverage and fault simulation issues related to multiple signature analysis (MSA) built-in self-test (BIST) schemes are treated here. A model to predict the fault coverage is presented. Based on this model, the nature of the fault coverage for MSA is discussed. The fault coverage of MSA is a function of both the signature sizes and the schedulings. The problem of optimal signature scheduling in MSA to minimize fault simulation time is discussed. Using the developed model, for an arbitrary circuit under test (CUT), given the optimal scheduling positions, given the fault coverage data before data compaction, and given an aliasing threshold, the optimal MSA for the CUT can be readily designed in terms of signature sizes and number of signatures. Analysis and experimental results are presented.

Name thesis:degree_name

Master of Applied Science - MASc

Level thesis:degree_level

master's

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor dc:publisher

University of British Columbia

Year dc:date

1993

Author dc:creator

• Zhang, Chun

Statement dc:rights

• For non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use.

Language dc:language

eng

Handle dc:identifier

http://hdl.handle.net/2429/1572

OAI identifier oai:identifier

oai:circle.library.ubc.ca:2429/1572