Combined Backscatter Moessbauer spectrometer/x-ray fluorescence analyzer (BaMS/XRF) for planetary surface materials.

Shelfer, Tad Douglas

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University of Alabama Birmingham

Combined Backscatter Moessbauer spectrometer/x-ray fluorescence analyzer (BaMS/XRF) for planetary surface materials.

dc:creator Shelfer, Tad Douglas

1992

Degree

thesis:*

Level thesis:degree_level: Dissertation
Year: 1992

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Shelfer, Tad Douglas

Identifiers

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Repository record dc:identifier: https://digitalcommons.library.uab.edu/etd-collection/5822
OAI identifier oai:identifier: oai:digitalcommons.library.uab.edu:etd-collection-6814

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Harvested from: University of Alabama Birmingham
Base URL: digitalcommons.library.uab.edu/do/oai/
Last updated: 2026-07-24
Source record: OAI-PMH GetRecord

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citation

Shelfer, Tad Douglas. Combined Backscatter Moessbauer spectrometer/x-ray fluorescence analyzer (BaMS/XRF) for planetary surface materials.. Dissertation thesis, 1992. https://digitalcommons.library.uab.edu/etd-collection/5822

Combined Backscatter Moessbauer spectrometer/x-ray fluorescence analyzer (BaMS/XRF) for planetary surface materials.

Degree

Author and committee

Identifiers

Chain of custody

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