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Tilburg University

Predicting No Fault Found (NFF) in semiconductor manufacturing : optimizing predictive maintenance using machine learning models

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Choi, C.
Contributors dc:contributor
  • Pourmostafa Roshan Sharami, J.

Rights

dc:rights
Statement dc:rights
  • (c) Universiteit van Tilburg
Language dc:language
eng

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:scr.uvt.nl:11110294

Chain of custody

source
Harvested from
Tilburg University
Base URL
arno.uvt.nl/oai/scr.uvt.nl.cgi
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
related terms
citation

Choi, C.. Predicting No Fault Found (NFF) in semiconductor manufacturing : optimizing predictive maintenance using machine learning models. 2024. https://tilburguniversity.on.worldcat.org/search?queryString=scr.uvt.nl:11110294