Quantitative and consistent tests for interlayer adhesion in laminated glass

The use of the double cleavage drilled compression (DCDC) for determining the toughness of glass/PVB interfaces has been examined. Experiments were conducted on two different types of samples: low and high adhesion. Stress and fracture analysis was conducted using the finite element method. The numerical analysis was first validated against simple strength of materials analyses and the measured load deflection response. The numerical analysis then provided the variation of stress intensity factors, energy release rate and fracture mode-mix with crack length for the extraction of toughness. Further microscopic analysis of the fracture surfaces elaborated different scenarios to describe the observed fracture mechanisms. At least partial delamination was observed, followed by finger shaped interface cracking and/or kinking. In addition, glass cracks branched to the interface and provoked partial interface delamination. In all cases, cracks were considered to be close enough to the interface to be considered as such. Values for the interfacial fracture toughness were extracted and found to be 160 J/m² and 230 J/m² for the low and high adhesion specimens, respectively.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Aerospace Engineering

Grantor

University of Texas at Austin

Year dc:date.issued

2006

Author dc:creator

• Kapetanovic, Alexandre Jean

Advisor dc:contributor.advisor

• Liechti, K.M.

• Double cleavage drilled compression (DCDC)
• Glass/PVB interfaces
• Delamination

Statement dc:rights

• Copyright © is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.

Language dc:language.iso

eng

Identifier

doi:10.15781/T2W669G0G

OAI identifier oai:identifier

oai:repositories.lib.utexas.edu:2152/47314