Secondary Ion Mass Spectroscopy and Spreading Resistance Analysis of Indium Implanted Silicon

Griffith, John A.

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Secondary Ion Mass Spectroscopy and Spreading Resistance Analysis of Indium Implanted Silicon

dc:creator Griffith, John A.

dc:date.issued1997

Abstract

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No abstract prepared.

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Griffith, John A.
Contributors dc:contributor: Gutierrez, Carlos
Crawford, James R.
Michalk, Victor

Subjects

dc:subject × 4

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Language dc:language: en

Identifiers

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Identifier: Griffith, J.A. (1997). Secondary ion mass spectroscopy and spreading resistance analysis of indium implanted silicon [Master's thesis, Southwest Texas State University].
OAI identifier oai:identifier: oai:tdl-ir.tdl.org:10877/19328

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Harvested from: Texas Digital Library
Base URL: tdl-ir.tdl.org/server/oai/request
Last updated: 2026-07-27
Source record: OAI-PMH GetRecord

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citation

Griffith, John A.. Secondary Ion Mass Spectroscopy and Spreading Resistance Analysis of Indium Implanted Silicon. 1997. https://hdl.handle.net/10877/19328

Secondary Ion Mass Spectroscopy and Spreading Resistance Analysis of Indium Implanted Silicon

Abstract

Author and committee

Subjects

Rights

Identifiers

Chain of custody

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