{"id":{"repo_id":"soton","oai_identifier":"oai:eprints.soton.ac.uk:42434"},"canonical_url":"https://search.dev.ndltd.org/etd/soton/oai:eprints.soton.ac.uk:42434","repository":{"repo_id":"soton","name":"University of Southampton","base_url":"https://eprints.soton.ac.uk/cgi/oai2"},"display":{"title":"Light-induced structural transition and reflectivity of a silica-gallium interface","abstract":"A broadband optical reflectometer with built-in thermal sample control was developed to study the linear properties of planar silica-gallium interfaces in the continuous range from 450 nm to 1650 nm with increasing and decreasing temperature in the range 12 °C to 36 °C, across the solid to melt phase transition. Transient pump-probe reflectivity measurements revealed the dynamics of a silica-gallium interface reflectivity change in the visible part of the spectrum for the first time. Reflectivity rise times of a few ps were observed and the accumulative nature of the reflectivity change with pump energy was seen. Recovery times of 1.2 µs just below melting were recorded for pump pulse duration of 0.4 µs. Thermal and non-thermal mechanisms of the reflectivity change have been identified and related to the properties of the interface.","abstract_html":"A broadband optical reflectometer with built-in thermal sample control was developed to study the linear properties of planar silica-gallium interfaces in the continuous range from 450 nm to 1650 nm with increasing and decreasing temperature in the range 12 °C to 36 °C, across the solid to melt phase transition. Transient pump-probe reflectivity measurements revealed the dynamics of a silica-gallium interface reflectivity change in the visible part of the spectrum for the first time. Reflectivity rise times of a few ps were observed and the accumulative nature of the reflectivity change with pump energy was seen. Recovery times of 1.2 µs just below melting were recorded for pump pulse duration of 0.4 µs. Thermal and non-thermal mechanisms of the reflectivity change have been identified and related to the properties of the interface.","abstract_has_math":false,"creators":["Albanis, Vassilios"],"institution":"University of Southampton","degree_name":"Ph.D.","degree_level":"doctoral","degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":["Zheludev, Nikolai"],"committee_chairs":[],"committee_members":[],"year":2003,"date_issued":"2003","date_published":"2003","updated_at":"2026-07-24T04:35:46Z","subjects":[],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":null,"outbound_label":null,"outbound_source":null},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Zheludev, Nikolai"]},{"key":"dc:creator","label":"Author","values":["Albanis, Vassilios"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2003"]},{"key":"dc:date.issued","label":"Date","values":["2003"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["Optoelectronics Research Centre (pre 2011 reorg)","Optoelectronics Research Centre"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["University of Southampton"]},{"key":"dc:relation.isreferencedby","label":"Dc Relation Isreferencedby","values":["https://eprints.soton.ac.uk/42434/"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["doctoral"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["Ph.D."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://eprints.soton.ac.uk/42434/1/Albanis_2003_thesis_2000T.pdf"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["A broadband optical reflectometer with built-in thermal sample control was developed to study the linear properties of planar silica-gallium interfaces in the continuous range from 450 nm to 1650 nm with increasing and decreasing temperature in the range 12 °C to 36 °C, across the solid to melt phase transition. Transient pump-probe reflectivity measurements revealed the dynamics of a silica-gallium interface reflectivity change in the visible part of the spectrum for the first time. Reflectivity rise times of a few ps were observed and the accumulative nature of the reflectivity change with pump energy was seen. Recovery times of 1.2 µs just below melting were recorded for pump pulse duration of 0.4 µs. Thermal and non-thermal mechanisms of the reflectivity change have been identified and related to the properties of the interface."]},{"key":"dc:format","label":"Dc Format","values":["text"]},{"key":"dc:title","label":"Title","values":["Light-induced structural transition and reflectivity of a silica-gallium interface"]}]}],"canonical_facts":{"dc:contributor.advisor":["Zheludev, Nikolai"],"dc:creator":["Albanis, Vassilios"],"dc:date":["2003"],"dc:date.issued":["2003"],"dc:description.abstract":["A broadband optical reflectometer with built-in thermal sample control was developed to study the linear properties of planar silica-gallium interfaces in the continuous range from 450 nm to 1650 nm with increasing and decreasing temperature in the range 12 °C to 36 °C, across the solid to melt phase transition. Transient pump-probe reflectivity measurements revealed the dynamics of a silica-gallium interface reflectivity change in the visible part of the spectrum for the first time. Reflectivity rise times of a few ps were observed and the accumulative nature of the reflectivity change with pump energy was seen. Recovery times of 1.2 µs just below melting were recorded for pump pulse duration of 0.4 µs. Thermal and non-thermal mechanisms of the reflectivity change have been identified and related to the properties of the interface."],"dc:format":["text"],"dc:identifier.uri":["https://eprints.soton.ac.uk/42434/1/Albanis_2003_thesis_2000T.pdf"],"dc:publisher.department":["Optoelectronics Research Centre (pre 2011 reorg)","Optoelectronics Research Centre"],"dc:publisher.institution":["University of Southampton"],"dc:relation.isreferencedby":["https://eprints.soton.ac.uk/42434/"],"dc:title":["Light-induced structural transition and reflectivity of a silica-gallium interface"],"dc:type":["Thesis"],"dc:type.qualificationlevel":["doctoral"],"dc:type.qualificationname":["Ph.D."]},"updated_at":"2026-07-24T04:35:46Z"}