Assessment and Analysis of Commercial Off the Shelf Devices for Space Applications

The continuous advancement of technology has significantly accelerated the exploration of space. Microelectronic devices have been extensively deployed in various settings, from low-Earth orbit to deep-space missions. However, the harsh radiation environment in space exposes electronic systems to intense cosmic rays and solar radiation, which poses significant risks of damage and failure. Ensuring the reliability and efficiency of these systems is therefore a crucial priority. This paper evaluates and tests the performance of commercial off the shelf electronic devices under space radiation conditions, aiming to enhance their radiation-hardened designs, protect sensitive equipment, and ensure the operational stability of spacecraft systems. Electronic switching regulators play a crucial role in stabilizing voltage levels within spacecraft, mitigating malfunctions caused by radiation-induced power fluctuations. These regulators incorporate multiple protective mechanisms, such as over-voltage, over-current, and thermal safeguards, which ensure system resilience in extreme environments. Similarly, optocouplers are indispensable in space missions, providing electrical isolation between high-voltage and low-voltage circuits to protect sensitive components and minimize electrical noise. Digital-to-Analog Converters (DACs) are also vital for converting digital data into analog signals, supporting critical spacecraft functions like telemetry, control systems, and sensor data processing. The rapid evolution of electronic technology has led to significant reductions in the feature sizes of modern integrated circuits (ICs), now measured on the nanometer scale. For example, the A18 and A18 Pro chips, featured in the iPhone 16 series released in September 2024, are fabricated using TSMC's second-generation 3-nanometer process. These advancements have improved computational power, minimized power consumption, and reduced costs. However, such miniaturization also increases the sensitivity of ICs to radiation, posing challenges for their reliable operation in space. Common radiation-induced effects include Single Event Effects (SEE), Total Ionizing Dose (TID) effects, and Displacement Damage Dose (DDD), all of which threaten the integrity of electronic components. This study focuses on analyzing the effects of space radiation on electronic devices, specifically examining SEE, TID, and DDD in components such as electronic switching regulators, optocouplers, and DACs. Experimental evaluations conducted include proton irradiation tests using an accelerator and assessments of total dose effects with cobalt-60 radiation. The findings demonstrate that electronic switching regulators and DACs exhibit acceptable performance under total dose conditions for short term missions on the International Space Station (ISS). However, high energy proton radiation causes significantly greater displacement damage to optocouplers compared to damage from gamma radiation generated by cobalt-60.

Name thesis:degree_name

Master of Science (M.Sc.)

Level thesis:degree_level

Masters

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Saskatchewan

Year dc:date.issued

2025

Author dc:creator

• Yang, Zhi Wu

Advisor dc:contributor.advisor

• Chen, Li

Committee members dc:contributor.committeemember

• Kasap, Safa
• Ko, Seok-Bum

• Switching regulator
• enhanced low dose rate sensitivity
• Optocoupler
• displacement damage dose
• total ionizing dose
• current transfer ratio
• Analog to digital converter
• single event effect
• current leakage.

Language dc:language.iso

en

Handle dc:identifier.uri

https://hdl.handle.net/10388/16400

OAI identifier oai:identifier

oai:harvest.usask.ca:10388/16400