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Rochester Institute of Technology
Wide bandgap semiconductors for harsh environment imaging: temperature dependence of p-n junction detector efficiency
Degree
thesis:*- Name thesis:degree_name
- Imaging Science (MS)
- Level thesis:degree_level
- Thesis
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Merritt, Danielle
- Contributors dc:contributor
-
- Ryne Raffaelle
Identifiers
dc:identifier.*- Repository record dc:identifier
- https://repository.rit.edu/theses/7776
- OAI identifier oai:identifier
- oai:repository.rit.edu:theses-8781