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Rochester Institute of Technology
High-resolution microscopy: Application to detector characterization and a new super-resolution technique
Degree
thesis:*- Level thesis:degree_level
- Dissertation
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Kavaldjiev, Daniel
- Contributors dc:contributor
-
- Ninkov, Zoran
Subjects
dc:subject × 1Identifiers
dc:identifier.*- Repository record dc:identifier
- https://repository.rit.edu/theses/6498
- OAI identifier oai:identifier
- oai:repository.rit.edu:theses-7503