{"id":{"repo_id":"rice","oai_identifier":"oai:repository.rice.edu:1911/89369"},"canonical_url":"https://search.dev.ndltd.org/etd/rice/oai:repository.rice.edu:1911/89369","repository":{"repo_id":"rice","name":"Rice University","base_url":"https://repository.rice.edu/server/oai/request"},"display":{"title":"The effect of glow discharge on silicon surface barrier detectors","abstract":"This paper is devoted to the study of the effect of charge particle bombardment on surface-barrier detectors in a glow discharge tube. It is found that positive ion bombardment causes an increase in junction capacitance of the detector, while the electron bombardment causes a decrease. This phenomenon can be accounted for by the change of the density of the surface charge residing on the surface of the bulk material of the detector; positive ion bombardment will decrease the surface charge density, and electron bombardment tends to increase the surface charge density.","abstract_html":"This paper is devoted to the study of the effect of charge particle bombardment on surface-barrier detectors in a glow discharge tube. It is found that positive ion bombardment causes an increase in junction capacitance of the detector, while the electron bombardment causes a decrease. This phenomenon can be accounted for by the change of the density of the surface charge residing on the surface of the bulk material of the detector; positive ion bombardment will decrease the surface charge density, and electron bombardment tends to increase the surface charge density.","abstract_has_math":false,"creators":["Liu, Boqing"],"institution":"Rice University","degree_name":"Master of Science","degree_level":"Masters","degree_discipline":"Engineering","degree_department":null,"school":null,"contributors":[],"advisors":["Rabson, Thomas A."],"committee_chairs":[],"committee_members":["MacPhail, M. R."],"year":1966,"date_issued":"1966","date_published":"1966","updated_at":"2026-07-24T04:10:39Z","subjects":[],"languages":["eng"],"rights":["Copyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder."],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/1911/89369","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Rabson, Thomas A."]},{"key":"dc:contributor.committeemember","label":"Committee Member","values":["MacPhail, M. R."]},{"key":"dc:creator","label":"Author","values":["Liu, Boqing"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2016-04-21T12:02:18Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2016-04-21T12:02:18Z"]},{"key":"dc:date.issued","label":"Date","values":["1966"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Rice University"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder."]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://hdl.handle.net/1911/89369"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["This paper is devoted to the study of the effect of charge particle bombardment on surface-barrier detectors in a glow discharge tube. It is found that positive ion bombardment causes an increase in junction capacitance of the detector, while the electron bombardment causes a decrease. This phenomenon can be accounted for by the change of the density of the surface charge residing on the surface of the bulk material of the detector; positive ion bombardment will decrease the surface charge density, and electron bombardment tends to increase the surface charge density."]},{"key":"dc:title","label":"Title","values":["The effect of glow discharge on silicon surface barrier detectors"]}]}],"canonical_facts":{"dc:contributor.advisor":["Rabson, Thomas A."],"dc:contributor.committeemember":["MacPhail, M. R."],"dc:creator":["Liu, Boqing"],"dc:date.accessioned":["2016-04-21T12:02:18Z"],"dc:date.available":["2016-04-21T12:02:18Z"],"dc:date.issued":["1966"],"dc:description.abstract":["This paper is devoted to the study of the effect of charge particle bombardment on surface-barrier detectors in a glow discharge tube. It is found that positive ion bombardment causes an increase in junction capacitance of the detector, while the electron bombardment causes a decrease. This phenomenon can be accounted for by the change of the density of the surface charge residing on the surface of the bulk material of the detector; positive ion bombardment will decrease the surface charge density, and electron bombardment tends to increase the surface charge density."],"dc:identifier.uri":["https://hdl.handle.net/1911/89369"],"dc:language.iso":["eng"],"dc:rights":["Copyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder."],"dc:title":["The effect of glow discharge on silicon surface barrier detectors"],"dc:type":["Thesis"],"thesis:degree_discipline":["Engineering"],"thesis:degree_level":["Masters"],"thesis:degree_name":["Master of Science"],"thesis:institution_name":["Rice University"]},"updated_at":"2026-07-24T04:10:39Z"}