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Rice University

Impedance spectroscopy response of aluminum-copper-silicon alloys

Abstract

dc:description.abstract

The effect of increased Cu and Si additions and heat treatment on the polarization resistance, oxide-layer/double-layer capacitance, open circuit potential and breakdown potential of Al-Cu-Si alloys was evaluated. Electrochemical impedance spectroscopy and DC polarization techniques were combined with mechanical property evaluations to determine the relationship between the microstructure of Al-Cu-Si alloys and the ability of their oxide layer to provide protection against corrosion in an aqueous 5% NH$\sb4$Cl solution. Alloys were investigated in both the solution-treated and artificially aged conditions. The solution-treatment procedure involved heating the alloys to 550$\sp\circ$C for 30 minutes and subsequently water-quenching. Artificial aging was carried out at 250$\sp\circ$C. Increased aging times of 1, 2, 8 and 32 hours at 250$\sp\circ$C were employed on Al-Cu(2%), Al-Si(2%) and Al-Cu(2%)-Si(2%) alloys in order to correlate the observed electrochemical behavior with the precipitation strengthening reactions which occur during age-hardening. These precipitation reactions govern the resultant microstructure and determine the mechanical behavior, electrochemical behavior and type of corrosion attack observed in Al-Cu-Si alloys. In general, an increase in the susceptibility to pitting corrosion was correlated to a decrease in the protective oxide layer thickness brought about as a result of increased Cu and Si additions in solution-treated alloys and the precipitation of Guinier-Preston zones in age-hardened alloys. Cu and Si atoms at the metal/oxide interface inhibit the diffusion of Al$\sp{+3}$ ions to the oxide/electrolyte interface thereby limiting the oxide-layer thickness. Increased aging times, leading to the formation of Guinier-Preston zones and a concomitant age-hardening peak, also decrease the total number of Al$\sp{+3}$ ions available for passivation and thereby decrease the oxide-layer thickness. Consequently, the oxide-layer/double-layer capacitance and the polarization resistance of the alloys are correlated to changes in the oxide-layer thickness and the loss in continuity of the oxide-layer with overaging. In addition, the open-circuit and breakdown potentials and the type of corrosion attack observed during anodic DC polarization scans was related to the type of alloying element and their distribution.

Degree

thesis:*
Name thesis:degree_name
Doctor of Philosophy
Level thesis:degree_level
Doctoral
Discipline thesis:degree_discipline
Engineering
Grantor
Rice University
Year dc:date.issued
1991

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Griffin, Alfred Joseph, Jr.
Advisor dc:contributor.advisor
  • Brotzen, Franz R.

Subjects

dc:subject × 2

Rights

dc:rights
Statement dc:rights
  • Copyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/1911/16444
OAI identifier oai:identifier
oai:repository.rice.edu:1911/16444

Chain of custody

source
Harvested from
Rice University
Base URL
repository.rice.edu/server/oai/request
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Griffin, Alfred Joseph, Jr.. Impedance spectroscopy response of aluminum-copper-silicon alloys. Doctoral thesis, Rice University, 1991. https://hdl.handle.net/1911/16444