Colloid phenomena in surface-modified polymer systems.

The objective of this thesis is the development and application of techniques to study modified polymer surfaces. Scanning probe microscopy (SPM) is used throughout this work as an experimental platform for the development of advanced techniques for the characterisation of polymer surfaces and adsorbed protein layers. A new method for the modification of polymeric microparticles has been proposed. A technique for the production of micro-patterned surfaces has been developed. The resulting changes can be effectively studied and understood using the techniques applied. AFM and XPS have been used to investigate the surface and near-surface properties of polymer substrates. Changes in surface forces introduced in the media in contact with modified polymer surfaces have been intensively studied. Correlation between Van der Waals (vdW) forces and interfacial processes including adhesion and wetting has been found. The electrostatic double force, acting in an electrolyte near a charged surface, has been found to be an important driving factor (attractive or repulsive) for the process of protein adsorption onto polymer surfaces. Physical properties of the adsorbed protein layer have been studied by QCM-D and an AFM based oscillation techniques. Variation of those properties with the environment humidity has been found. A new AFM-based method, which allows the characterisation of the surface hydrophobicity has been proposed. The present prospective work on nano-capillarity is aimed at triggering attention to the method for the submicron characterisation of the surface wettability, adsorption and hydrophobicity.

Grantor dc:publisher.institution

Robert Gordon University

Year dc:date.issued

2006

Author dc:creator

• Lubarsky, Gennady V.

Advisor dc:contributor.advisor

• B. Bradley and M. Davidson

• Polymer surface modification
• Scanning probe microscopy (SPM)
• Protein adsorption
• Micro‑patterned surfaces
• Atomic force microscopy (AFM)
• X‑ray photoelectron spectroscopy (XPS)
• Surface forces
• Hydrophobicity

Language dc:language

en

Identifier

oai:rgu-repository.worktribe.com:2807467
https://doi.org/10.48526/rgu-wt-2807467

OAI identifier oai:identifier

oai:rgu-repository.worktribe.com:2807467