Electronic and Magnetic Characterization by Scanning Probe Microscopy: Frustrated Magnetism in Nd(0001) and the Electronic Structure of V2S3 Monolayers

Kamber, U.

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S.I. : s.n.

Electronic and Magnetic Characterization by Scanning Probe Microscopy: Frustrated Magnetism in Nd(0001) and the Electronic Structure of V2S3 Monolayers

dc:creator Kamber, U.

dc:date2021

Abstract

dc:description

Contains fulltext : 238532.pdf (Publisher’s version ) (Open Access)

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Grantor dc:publisher: S.I. : s.n.
Year dc:date: 2021

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Kamber, U.
Contributors dc:contributor: Khajetoorians, A.A.
Wegner, D.

Subjects

dc:subject × 1

Scanning Probe Microscopy

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dc:identifier.*

Repository record dc:identifier: https://repository.ubn.ru.nl/handle/2066/238532
OAI identifier oai:identifier: oai:repository.ubn.ru.nl:2066/238532

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Harvested from: Radboud University Nijmegen
Base URL: repository.ubn.ru.nl/oai/request
Last updated: 2026-07-24
Source record: OAI-PMH GetRecord

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citation

Kamber, U.. Electronic and Magnetic Characterization by Scanning Probe Microscopy: Frustrated Magnetism in Nd(0001) and the Electronic Structure of V2S3 Monolayers. S.I. : s.n., 2021. https://repository.ubn.ru.nl/handle/2066/238532

Electronic and Magnetic Characterization by Scanning Probe Microscopy: Frustrated Magnetism in Nd(0001) and the Electronic Structure of V2S3 Monolayers

Abstract

Degree

Author and committee

Subjects

Identifiers

Chain of custody

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