The binomial error model applied to time-limit tests

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Nijmegen

dc:creator Ven, A.H.G.S. van der

dc:date1969

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Contains fulltext : mmubn000001_24772260x.pdf (Publisher’s version ) (Open Access)

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Ven, A.H.G.S. van der. The binomial error model applied to time-limit tests. Nijmegen, 1969. http://hdl.handle.net/2066/147747