Power Cycling with Switching Losses

This paper deals with a method to additionally heat with switching losses in a classical power cycling test, as it is often used for power semiconductors.The fundamentals of testing, switching behavior, thermal and electrical characteristics of semiconductors are covered.The core of the work is the construction, start-up and solution of technical problems during the testing of the test stand. Another aspects are the measurement and software challenges in generating the pulse pattern and in evaluating the results. The last part of the work deals with the testing of different types of semiconductors, such as IGBTs and MOSFETs, which were also made of different materials, such as silicon and silicon carbide, and had different voltage classes.

Level thesis:degree_level

thesis.doctoral

Grantor dc:publisher

Technische Universität Chemnitz

Year

2020

Author dc:creator

• Seidel, Peter

Contributors dc:contributor

• Lutz, Josef
• Bakran, Mark-Matthias

• Power electronics
• Semiconductor
• Power cycling test
• Switching losses
• Silicon carbide