{"id":{"repo_id":"portland-state","oai_identifier":"oai:pdxscholar.library.pdx.edu:open_access_etds-3028"},"canonical_url":"https://search.dev.ndltd.org/etd/portland-state/oai:pdxscholar.library.pdx.edu:open_access_etds-3028","repository":{"repo_id":"portland-state","name":"Portland State University","base_url":"https://pdxscholar.library.pdx.edu/do/oai/"},"display":{"title":"Training Set Design for Test Removal Classication in IC Test","abstract":"","abstract_html":null,"abstract_has_math":false,"creators":["Hassan Ranganath, Nagarjun"],"institution":null,"degree_name":"Master of Science (M.S.) in Electrical and Computer Engineering","degree_level":"Thesis","degree_discipline":null,"degree_department":null,"school":null,"contributors":["W. Robert Daasch"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":null,"date_issued":"","date_published":null,"updated_at":"2026-07-27T20:32:53Z","subjects":["Integrated circuits -- Testing","Machine learning","Computer adaptive testing","Electrical and Computer Engineering"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://pdxscholar.library.pdx.edu/open_access_etds/2028","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["W. Robert Daasch"]},{"key":"dc:creator","label":"Author","values":["Hassan Ranganath, Nagarjun"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science (M.S.) in Electrical and Computer Engineering"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Integrated circuits -- Testing","Machine learning","Computer adaptive testing","Electrical and Computer Engineering"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://pdxscholar.library.pdx.edu/open_access_etds/2028"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:title","label":"Title","values":["Training Set Design for Test Removal Classication in IC Test"]}]}],"canonical_facts":{"dc:contributor":["W. Robert Daasch"],"dc:creator":["Hassan Ranganath, Nagarjun"],"dc:identifier":["https://pdxscholar.library.pdx.edu/open_access_etds/2028"],"dc:subject":["Integrated circuits -- Testing","Machine learning","Computer adaptive testing","Electrical and Computer Engineering"],"dc:title":["Training Set Design for Test Removal Classication in IC Test"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["Master of Science (M.S.) in Electrical and Computer Engineering"]},"updated_at":"2026-07-27T20:32:53Z"}