Manufacturing and In-Field Testing Techniques

L'abstract è presente nell'allegato / the abstract is in the attachment

Grantor dc:publisher

Politecnico di Torino

Year dc:date

2026

Author dc:creator

• FILIPPONI, GABRIELE

Contributors dc:contributor

• BERNARDI, PAOLO
• CANTORO, RICCARDO

• Functional Testing
• Stress Functional Pattern
• AI Hardware Accelerator
• Burn-In
• Automotive Testing
• System-Level Test
• Fault Simulation
• Automotive SoC
• Functional Safety
• Logic Built-In Self-Test (LBIST)
• Silicon Lifecycle Management (SLM)
• Logic Diagnosi
• Multiple Input Signature Register (MISR)
• In-Field Data Collection
• Settore IINF-05/A - Sistemi di elaborazione delle informazioni

Statement dc:rights

• info:eu-repo/semantics/openAccess
• license:Creative commons
• license uri:http://creativecommons.org/licenses/by-nc-nd/4.0/

Language dc:language

eng

Handle dc:identifier

https://hdl.handle.net/11583/3009437

OAI identifier oai:identifier

oai:iris.polito.it:11583/3009437