Test and diagnosis of memories embedded in Automotive SoCs

L'abstract è presente nell'allegato / the abstract is in the attachment

Grantor dc:publisher

Politecnico di Torino

Year dc:date

2025

Author dc:creator

• INSINGA, GIORGIO

Contributors dc:contributor

• BERNARDI, PAOLO
• CANTORO, RICCARDO

• Automotive Systems-on-Chips (SoCs)
• embedded memorie
• diagnostic data collection
• voltage droop mitigation
• fault shape
• failure bitmap encoding
• memory testability
• fault classification
• memory organization reconstruction
• radiation effect
• neural network
• memory reliability
• diagnostic data processing
• fault pattern recognition
• Settore IINF-05/A - Sistemi di elaborazione delle informazioni

Statement dc:rights

• info:eu-repo/semantics/openAccess
• license:Creative commons
• license uri:http://creativecommons.org/licenses/by-nc-nd/4.0/

Language dc:language

eng

Identifier

http://dx.doi.org/10.13121/polito/porto/2998590
10.13121/polito/porto/2998590

OAI identifier oai:identifier

oai:iris.polito.it:11583/2998590